Modeling of proton induced SEUs

Akkerman, A.; Barak, J.; Levinson, J.; Lifshitz, Y.

doi:10.1016/0969-806x(95)00440-9

Cited by 20 publications

(5 citation statements)

References 41 publications

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“…In our experimental studies with devices and thin SBDs and in our previous modeling [2,3], we found only a small anisotropy of the charge deposition and proton induced SEU cross sections. Our modeling however considered large lateral dimensions only, which is valid for our SBD experiments but not for actual devices.…”

Section: Figurel-mentioning

confidence: 79%

“…Our experimental studies [2,3] of the angular dependence of proton induced SEU in devices and of charge collection in SBDs show a very small anisotropy. A very small anisotropy was also found in most of the other published works.…”

Section: Discussionmentioning

confidence: 95%

“…[2,3]) originating from two sources: (i) the previous calculations refer to large lateral dimensions where the maximal anisotropy of the proton events (determined by the low mass fragments) is low (13 even in our present calculations), (ii) the correlation between the energy distribution and the angular distribution of the fragments (Le. energetic fragments tend to be emitted in the forward direction) that was not considered by us previously.…”

Section: Discussionmentioning

confidence: 98%

“…Using o(0)=n(O)/(focosO) would erroneously increase the experimental angular behavior by a factor of licos 0. All the experimental and calculated values presented by us here or in the past [2,3] consider the 'angular dependence of the proton induced sensitivities with respect to fo (i.e. o(e)=n(0)/fO).…”

Section: Figurel-mentioning

confidence: 99%

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The effect of the angle of incidence on proton induced single events in devices-a critical assessment by modeling

Akkerman

Barak

Levinson

1998

IEEE Trans. Nucl. Sci.

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The effect of the angle of incidence on the proton induced single events in devices with finite dimensions is studied using a modified Monte Carlo model. The physical reasons for the existence or the absence of an anisotropy of the single event occurrence (with respect to the proton angle of incidence) are highlighted for the first time. Several different cases are found: (1) A significant anisotropy is predicted for devices with small lateral dimensions, a smaller sensitive layer thickness, and a large critical energy. The origin of this angular dependence is shown to be the contribution of the highly anisotropic medium mass fragments which is dominant for these conditions. ( 2 ) Published experimental data indicate only a small anisotropy in practical devices, which are characterized by a small critical deposited energy needed for SEU. It is shown that for these devices, most of the charge is created by the heavy mass fragments, which are isotropic. (3) In surface barrier detectors (SBDs) which have large lateral dimensions the effect of the isotropic light mass fragments takes over and the anisotropy for proton events is small even for large critical energies and a small sensitive layer thickness. The conclusion of the present work is that the single event rate in space can be evaluated by the normal incidence cross sections for all devices which have a significant sensitivity for proton induced events.

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Section: Figurel-mentioning

confidence: 79%

Section: Discussionmentioning

confidence: 95%

Section: Discussionmentioning

confidence: 98%

Section: Figurel-mentioning

confidence: 99%

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The effect of the angle of incidence on proton induced single events in devices-a critical assessment by modeling

Akkerman

Barak

Levinson

1998

IEEE Trans. Nucl. Sci.

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“…Protons indirectly induce SEUs since their elastic and inelastic interactions create secondary projectiles. They consist of neutrons, alpha particles and heavy recoiling ions [22].…”

Section: Results Of Sel Testsmentioning

confidence: 99%

Single event effect characterization of the mixed-signal ASIC developed for CCD camera in space use

Nakajima

Fujikawa

Mori

et al. 2013

Nuclear Instruments and Methods in Physics Research Section A:

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We present the single event effect (SEE) tolerance of a mixed-signal application-specific integrated circuit (ASIC) developed for a charge-coupled device camera onboard a future X-ray astronomical mission. We adopted proton and heavy ion beams at HIMAC/NIRS in Japan. The particles with high linear energy transfer (LET) of 57.9 MeV·cm 2 /mg is used to measure the single event latch-up (SEL) tolerance, which results in a sufficiently low cross-section of σ SEL < 4.2 × 10 −11 cm 2 /(Ion×ASIC). The single event upset (SEU) tolerance is estimated with various kinds of species with wide range of energy. Taking into account that a part of the protons creates recoiled heavy ions that has higher LET than that of the incident protons, we derived the probability of SEU event as a function of LET. Then the SEE event rate in a low-earth orbit is estimated considering a simulation result of LET spectrum. SEL rate is below once per 49 years, which satisfies the required latch-up tolerance. The upper limit of the SEU rate is derived to be 1.3×10 −3 events/sec. Although the SEU events cannot be distinguished from the signals of X-ray photons from astronomical objects, the derived SEU rate is below 1.3 % of expected non X-ray background rate of the detector and hence these events should not be a major component of the instrumental background.

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