2003
DOI: 10.1109/tns.2003.820735
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Modeling of proton-induced CCD degradation in the Chandra X-ray Observatory

Abstract: Abstruct-Modeling results are presented for proton-induced degradation of chargecoupled devices (CCDs) used in the Advanced CCD Imaging Spectrometer instrument on the Chandra X-Ray Observatory. A methodology is described that provides insights regarding degradation mechanism and onorbit performance for front-illuminated and back-illuminated CCDs Proton-induced changes in charge transfer inefficiency are modeled. The observed amount of on-orbit degradation can be accounted for using a proton spectrum at the CCD… Show more

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Cited by 24 publications
(16 citation statements)
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“…The magnets are assumed to be characterized by an uniform magnetization M. In order to generate an intense field, hard magnetic materials, like Samarium-Cobalt magnets (SmCo 5 (right) The profile of the magnetic field intensity in the mid-plane, along a median sector, where the magnetic field has the minimum intensity. The radial extension of the field is sufficient to cover the radii of the SIMBOL-X mirrors.…”
Section: A Possible Design For the Simbol-x Proton Divertermentioning
confidence: 99%
See 1 more Smart Citation
“…The magnets are assumed to be characterized by an uniform magnetization M. In order to generate an intense field, hard magnetic materials, like Samarium-Cobalt magnets (SmCo 5 (right) The profile of the magnetic field intensity in the mid-plane, along a median sector, where the magnetic field has the minimum intensity. The radial extension of the field is sufficient to cover the radii of the SIMBOL-X mirrors.…”
Section: A Possible Design For the Simbol-x Proton Divertermentioning
confidence: 99%
“…At that time, the unwanted capability of the X-ray mirror assembly to reflect and focus high-energy particles -in addition to X-rays -was underestimated, therefore the ACIS had been effectively shielded against particle background from all direction, but that of the mirrors. The range of soft protons in Silicon (0.92 µm for 100 keV protons 5 ) is sufficient for them to traverse the top layers of the CCD and create charge traps in the sensitive region, resulting in an energy sensitivity degradation. In particular, for Chandra's ACIS detector the most dangerous protons seemed to be those with kinetic energies from 100 to 200 keV 6 .…”
Section: Introductionmentioning
confidence: 99%
“…A detailed modeling of the NIEL damage by low energy protons to Chandra ACIS is reported in [3]. The most sensitive region of the CCD, i.e., the buried channel is at a silicon equivalent depth of m to the incident protons, i.e., it is behind the optical filter and the top layers of the CCD for the front illuminated case.…”
Section: Introductionmentioning
confidence: 99%
“…The most sensitive region of the CCD, i.e., the buried channel is at a silicon equivalent depth of m to the incident protons, i.e., it is behind the optical filter and the top layers of the CCD for the front illuminated case. The range of 100 keV protons in silicon is in the order of 0.92 m [3], [4], thus only incident protons with energy above 100 keV can reach the sensitive region of the CCD and cause damage. The fact that the incident proton spectrum is very steep [3]- [5], implies that the majority of the damaging protons are of energy just above keV.…”
Section: Introductionmentioning
confidence: 99%
“…The unavoidable imperfections of the above physical process and the corrections that are required to mitigate the resulting limitations have been studied by all manufacturers and scientific users of CCDs (e.g., Rodricks & Venkataraman 2005;Burke et al 2005), and especially at the occasion of every space instrument embarking one (e.g., Defise et al 1997;Lo & Srour 2003;Sirianni et al 2004;Schou 2004;Penquer et al 2009;Gilard et al 2010).…”
Section: Charge-coupled Devicesmentioning
confidence: 99%