We grew single crystals of cadmium telluride, doped with bromine by the Bridgman method, annealed them under a cadmium overpressure (P Cd = 10 2-10 5 Pa) at 800-1100 K, and investigated their electrical properties at high-and low-temperature. The influence of impurities on 2 Cd) 0. Their content varies with the annealing temperature and the vapor pressure of the component; the concentration of other defects is much smaller and almost does not affect the electron density.