1999
DOI: 10.1007/s003390050991
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Modeling light trapping and electronic transport of waffle-shaped crystalline thin-film Si solar cells

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Cited by 42 publications
(12 citation statements)
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“…2 denotes the normal transmittance of specular light through the wafer of thickness W. For every wavelength, the wafer has the absorption coefficient α and refractive index n. Similarly, T d denotes the transmission factor of fully randomized light; see [15] for an analytic expression for T d . The upward and downward light flows shown in Figure 2 define 10 linear equations.…”
Section: Optical Modelmentioning
confidence: 99%
“…2 denotes the normal transmittance of specular light through the wafer of thickness W. For every wavelength, the wafer has the absorption coefficient α and refractive index n. Similarly, T d denotes the transmission factor of fully randomized light; see [15] for an analytic expression for T d . The upward and downward light flows shown in Figure 2 define 10 linear equations.…”
Section: Optical Modelmentioning
confidence: 99%
“…Light is being incident from the front electrode which is a transparent conducting glass plate having high work function. Materials having low work function are used as back electrodes [11][12][13][14]. Generally, indium tin oxide (ITO)-coated glass plate is used as a conducting glass plate.…”
Section: Introductionmentioning
confidence: 99%
“…Approaches for this include light trapping by means of rough or textured interfaces [1,2] and increasing the reflectance at the backside of the absorber by replacing the traditional molybdenum back contact with a more reflective layer [3]. We have previously suggested using zirconium nitride (ZrN) as such a back-reflector layer [4].…”
Section: Introductionmentioning
confidence: 99%