2005
DOI: 10.21236/ada430925
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Modeling, Fabrication, and Testing of a Piezoelectric MEMS Vibrational Energy Reclamation Device

Abstract: Sensors and Electron Devices Directorate, ARLApproved for public release; distribution unlimited. Public reporting burden for this collection of information is estimated to average 1 hour per response, including the time for reviewing instructions, searching existing data sources, gathering and maintaining the data needed, and completing and reviewing the collection information. Send comments regarding this burden estimate or any other aspect of this collection of information, including suggestions for reduci… Show more

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Cited by 4 publications
(3 citation statements)
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“…where avg is the average Young's modulus of the beam's materials, , , and are the width, thickness, and length of each beam, and avg of the composite layers can be calculated using [30]…”
Section: Determination Of Resonance Frequency Mass Sensitivitymentioning
confidence: 99%
“…where avg is the average Young's modulus of the beam's materials, , , and are the width, thickness, and length of each beam, and avg of the composite layers can be calculated using [30]…”
Section: Determination Of Resonance Frequency Mass Sensitivitymentioning
confidence: 99%
“…where; E avg is the average Young's modulus of the CMOS layers used and w, t, and l are width, thickness and length of the beam, respectively. E avg of a composite structure with n number of layers with a total thickness t can be calculated using (7) [15].…”
Section: A Resonance Frequency and Mass Sensitivitymentioning
confidence: 99%
“…The concentration sensitivity (Hz/g/m 3 ) in (15) is converted to concentration sensitivity (Hz/ppm) by using (16) [6]. (16) where W is the molecular weight of the analyte in g/mol, P is the partial pressure (in Pascal) of the analyte at the given temperature (in Kelvin) T, and R is the ideal gas constant and it is 8.3145 J.mol -1 K -1 .…”
Section: Gas Concentration Sensitivity (S G ) and Limit Of Detectimentioning
confidence: 99%