Modeling, Design, and Verification for the Analog Front-End of a MEMS-Based Parallel Scanning-Probe Storage Device

Hagleitner, Christoph; Bonaccio, T.; Rothuizen, H.; Lienemann, Jan; Wiesmann, D.; Cherubini, Giovanni; Korvink, Jan G.; Eleftheriou, Evangelos

doi:10.1109/jssc.2007.900287

Cited by 20 publications

(5 citation statements)

References 23 publications

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“…The fabrication process is based on a new approach in which the cantilever array is transferred and interconnected to its CMOS counterpart chip on a full wafer-to-wafer basis [17]. The AFE design supports the parallel write and read operations of the cantilevers in the array [21,22]. Specifically, at the input of each cantilever channel is a high-voltage switch matrix that selects the actual operation of the respective cantilever (read, write, or inactive).…”

Section: Device Description and Identificationmentioning

confidence: 99%

“…The analog part of the read channel is implemented in the integrated AFE CMOS chip that includes the complete circuitry to support parallel operation of the cantilevers [21,22]. The design of the on-chip readchannel circuitry allows reliable detection of the tiny signal current obtained with the thermal sensing scheme (DR/R , 10 À3 for a typical indentation).…”

Section: Data Read Channelmentioning

confidence: 99%

See 1 more Smart Citation

Probe-based ultrahigh-density storage technology

et al. 2008

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Ultrahigh storage densities can be achieved by using a thermomechanical scanning-probe-based data-storage approach to write, read back, and erase data in very thin polymer films. High data rates are achieved by parallel operation of large twodimensional arrays of cantilevers that can be batch fabricated by silicon-surface micromachining techniques. The very high precision required to navigate the storage medium relative to the array of probes is achieved by microelectromechanical system (MEMS)based x and y actuators. The ultrahigh storage densities offered by probe-storage devices pose a significant challenge in terms of both control design for nanoscale positioning and read-channel design for reliable signal detection. Moreover, the high parallelism necessitates new dataflow architectures to ensure high performance and reliability of the system. In this paper, we present a small-scale prototype system of a storage device that we built based on scanning-probe technology. Experimental results of multiple sectors, recorded using multiple levers at 840 Gb/in 2 and read back without errors, demonstrate the functionality of the prototype system. This is the first time a scanning-probe recording technology has reached this level of technical maturity, demonstrating the joint operation of all building blocks of a storage device.

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Section: Device Description and Identificationmentioning

confidence: 99%

Section: Data Read Channelmentioning

confidence: 99%

Probe-based ultrahigh-density storage technology

et al. 2008

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“…A lower temperature corresponds to a lower cantilever electrical resistance. An analog front end therefore needs to be able to discriminate between a signal varying between two values of resistance, R, compared to the baseline resistivity, R. The signal-to-noise ratio, or R/R, is less than 10 −3 [61].…”

Section: Analog Front Endmentioning

confidence: 99%

Probe Storage

Gemelli

Abelmann

Engelen

et al. 2010

Memory Mass Storage

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This chapter gives an overview of probe-based data storage research over the last three decades, encompassing all aspects of a probe recording system. Following the division found in all mechanically addressed storage systems, the different subsystems (media, read/write heads, positioning, data channel, and file system) will be discussed. In the media subsection various recording media will be treated, such as polymer based, phase change, ferroelectric and magnetic. In the probe array subsection various generations of thermal probes will be discussed, as well as examples of alternative write probes using currents, electric or magnetic fields, and different principles for data detection. Special attention is paid to parallel readout of probe arrays. In the positioning section, examples will be shown of electric and magnetic scanners, either precision engineered or realized by micromachining technologies, or combinations thereof. In the systems subsection the data channel will be discussed, including the read/write electronics circuitry, data detection, and coding algorithms. Special attention is paid to the writing strategy and considerations for probe-based storage file systems.

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“…Modern circuit design simulation suites (e.g., Spectre™) offer the possibility of simulating arbitrary combinations of high-level hardware-description languages (HDL, e.g., VerilogA, VHDL-AMS, C++ derivatives) together with digital circuitry. The MEMS structures can be incorporated by using equivalent circuit models [149], automatically reducing the complex finiteelement models (FEM) to a multi-domain behavioral model using model-order reduction (MOR) [150]. Although some EDA providers for MEMS design software are starting to offer interfaces to the standard software packages used for CMOS verification (e.g., Coventor [151], Tanner [152]), in most cases custom solutions for verification must be developed.…”

Section: Design Toolsmentioning

confidence: 99%

More than Moore

Zhang¹,

Roosmalen²

2009

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Modeling, Design, and Verification for the Analog Front-End of a MEMS-Based Parallel Scanning-Probe Storage Device

Cited by 20 publications

References 23 publications

Probe-based ultrahigh-density storage technology

Probe-based ultrahigh-density storage technology

Probe Storage

More than Moore

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