2020
DOI: 10.1109/lemcpa.2020.2979227
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Model-Based System-Level EMI/EMC Simulation for BCI Pass-Fail Prediction

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Cited by 6 publications
(4 citation statements)
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“…In terms of radiated emission, an EM model formulated on the superposition of fields produced in the far field region by loop currents flowing towards the IC and package pins is proposed. A model-based simulation technique for characterization of immunity at system level at a premature design stage is presented which comprised of a hybrid 3D full wave, transmission line and circuit solver methodology and models for all components including ICs [44]. The bulk current injection (BCI) failure for a simple PCB comprised of a p-nitrophenol (PNP) transistor IC, namely 2SA1576 is predicted.…”
Section: Review On Various Methodologies Used In Recent Work To Predict Emimentioning
confidence: 99%
See 1 more Smart Citation
“…In terms of radiated emission, an EM model formulated on the superposition of fields produced in the far field region by loop currents flowing towards the IC and package pins is proposed. A model-based simulation technique for characterization of immunity at system level at a premature design stage is presented which comprised of a hybrid 3D full wave, transmission line and circuit solver methodology and models for all components including ICs [44]. The bulk current injection (BCI) failure for a simple PCB comprised of a p-nitrophenol (PNP) transistor IC, namely 2SA1576 is predicted.…”
Section: Review On Various Methodologies Used In Recent Work To Predict Emimentioning
confidence: 99%
“…The experimental setup for finding conducted and radiated emissions accounts for an uncertainty of around ±2.5 dB on the considered frequency range. [44] Bulk current injection and simulation using MOM.…”
mentioning
confidence: 99%
“…Many studies reveal that electromagnetic power is converted into voltage variations on the signal links [10][11][12]. Therefore, the simulation and test methods are proposed, which have achieved good results [13][14][15]. In addition, numerous studies have analyzed the coupling of electronic systems under the action of electromagnetic pulses [16][17][18][19].…”
Section: For Peer Review 2 Of 14mentioning
confidence: 99%
“…In the background, the use of bulk current injection (BCI) [3][4][5][6][7][8][9][10][11][12][13][14][15][16] to replace the high-field radiation effects test offers a viable solution to the challenges previously highlighted. Currently, the technology is mainly implemented in the conducted susceptibility.…”
Section: Introductionmentioning
confidence: 99%