2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) 2022
DOI: 10.1109/dft56152.2022.9962348
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Model-Based Analysis of Single-Event Upset (SEU) Vulnerability of 6T SRAM Using FinFET Technologies

Semiu A. Olowogemo
1
,
Hao Qiu
2
,
Bor-Tyng Lin
3
et al.
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