Machine Learning-Assisted Single-Event Transient Model of 12nm FinFETs for Circuit-Level Simulation

Lin, Jianwen; Cai, Linlin; Chen, Yutao; Zhang, Haoyu; Chen, Wangyong

doi:10.1109/asicon58565.2023.10396190

2023 IEEE 15th International Conference on ASIC (ASICON) 2023

DOI: 10.1109/asicon58565.2023.10396190

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Machine Learning-Assisted Single-Event Transient Model of 12nm FinFETs for Circuit-Level Simulation

Jianwen Lin,

Linlin Cai,

Yutao Chen

et al.

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Machine Learning-Assisted Single-Event Transient Model of 12nm FinFETs for Circuit-Level Simulation

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