1962
DOI: 10.1109/jrproc.1962.288321
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Minimum Size and Maximum Packing Density of Nonredundant Semiconductor Devices

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Cited by 116 publications
(41 citation statements)
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“…Building on Bell Labs' core theoretical and technological advancements, subsequent contributions to the art of semiconductor manufacturing came from both large, established companies and small, young firms, which recent research indicates uniquely benefited from access to Bell Labs' technology made possible by the consent decree 5 . By the close of the 1950s, even as semiconductor shipments averaged annual growth rates of over 50%, some researchers began to project limits to progress in BJT transistors and their applications, at best two orders of magnitude away [6][7][8][9] . Many of these early warnings rested on erroneous assumptions about limits to transistor feature size, but semiconductor electronics faced pressing reliability challenges at the circuit level.…”
Section: Before Moore's Lawmentioning
confidence: 99%
“…Building on Bell Labs' core theoretical and technological advancements, subsequent contributions to the art of semiconductor manufacturing came from both large, established companies and small, young firms, which recent research indicates uniquely benefited from access to Bell Labs' technology made possible by the consent decree 5 . By the close of the 1950s, even as semiconductor shipments averaged annual growth rates of over 50%, some researchers began to project limits to progress in BJT transistors and their applications, at best two orders of magnitude away [6][7][8][9] . Many of these early warnings rested on erroneous assumptions about limits to transistor feature size, but semiconductor electronics faced pressing reliability challenges at the circuit level.…”
Section: Before Moore's Lawmentioning
confidence: 99%
“…Single-event upsets (SEUs) were first predicted in 1962 [22]. Ironically, they were originally predicted as an unavoidable consequence of the trend in shrinking electronic device sizes, which was predicted to make devices susceptible to SEUs via terrestrial radiation environments.…”
Section: Ii3 Singe-event Effects In Microelectronicsmentioning
confidence: 99%
“…Since the first prediction of SEE (single-event effect) in microelectronics in 1962 by Wallmark and Marcus [1], researchers and engineers who work on space-based systems have been concerned about the effects of cosmic rays on mission reliability. Radiation environment in aerospace is shown in Figure 1.…”
Section: Introductionmentioning
confidence: 99%