Mie-Scattering Ellipsometry

Hayashi, Yasuaki; Sanpei, Akio

doi:10.5772/intechopen.70278

Cited by 3 publications

(2 citation statements)

References 32 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The integral photography technique has great potential of versatile applications for plasma measurement. With the help of Mie-scattering ellipsometry technique [31,32], it would bring information about the size of particles in addition to sixdimensional information about position and velocity. Combined with intrinsic fluorescence spectroscopy [33], specification of dust's materials will be available not only for standard polymer but also for unusual target such as microorganisms [34,35].…”

Section: Expected Future Of the Integral Photography Technique For Plmentioning

confidence: 99%

Integral Photography Technique for Three-Dimensional Imaging of Dusty Plasmas

Sanpei¹

2020

Progress in Fine Particle Plasmas

Self Cite

View full text Add to dashboard Cite

The integral photography technique has an advantage in which instantaneous three-dimensional (3D) information of objects can be estimated from a singleexposure picture obtained from a single viewing port. Recently, the technique has come into use for scientific research in diverse fields and has been applied to observe fine particles floating in plasma. The principle of integral photography technique and a design of a light-field camera for dusty plasma experiments are reported. The important parameters of the system, dependences of the size of the imaging area, and the spatial resolution on the number of lenses, pitch, and focal length of the lens array are calculated. Designed recording and reconstruction system is tested with target particles located on known positions and found that it works well in the range of dusty plasma experiment. By applying the integral photography technique to the obtained experimental image array, the 3D positions of dust particles floating in an RF plasma are identified.

show abstract

Section: Expected Future Of the Integral Photography Technique For Plmentioning

confidence: 99%

Integral Photography Technique for Three-Dimensional Imaging of Dusty Plasmas

Sanpei¹

2020

Progress in Fine Particle Plasmas

Self Cite

View full text Add to dashboard Cite

show abstract

“…Details about the analysis of fine particles by Mie-scattering ellipsometry are described in Refs. [30,32,33]. Figure 8 shows a (Ψ, Δ) trajectory as a result of Mie-scattering ellipsometry measurement for spherical carbon particles growing by coating in a plasma including methane (Figure 8(A)).…”

Section: Analysis By Mie-scattering Ellipsometrymentioning

confidence: 99%

Observation and Analyses of Coulomb Crystals in Fine Particle Plasmas

Hayashi¹

2020

Progress in Fine Particle Plasmas

Self Cite

View full text Add to dashboard Cite

Observations of crystal-like ordering of fine particles in plasmas were first reported in 1994, when we succeeded to observe it by growing carbon fine particles in a methane plasma. Video cameras and Mie-scattering ellipsometry were applied for the analyses of fine particles and their crystal ordering. 3D and 2D crystal structures were observed for smaller and larger particles, respectively. The former structures were fcc, fco, and bct, but bcc structure was not observed. The result is due to the fact that the rearrangement from fcc to fco or bct occurs with both constant particle density in horizontal planes and constant interplane vertical distance. Behaviors of fine particles under microgravity were observed and analyzed using ready-made and injected fine particles. Its experimental result showed that the resultant force composed of electrostatic and ion drag forces pushes fine particles outward from the center forming a void.

show abstract

Mie-Scattering Ellipsometry

Hayashi¹,

Sanpei²

2017

Ellipsometry - Principles and Techniques for Materials Characterization

Self Cite

View full text Add to dashboard Cite

The size and refractive index of particles can be analyzed through the measurement of polarization state of scattered light. The change of polarization state in Mie scattering has been represented by ellipsometric parameters, Ψ and Δ, like the reflection ellipsometry. The analysis method is called Mie-scattering ellipsometry. By in-process Miescattering ellipsometry, the growth processes of carbon particles in argon plasma and in methane plasma were analyzed. It was found that carbon particles grow by coagulation in argon plasma, while they grow by carbon coating in methane plasma. It is also shown that imaging Mie-scattering ellipsometry has the potential for the easier confirmation of optical adjustment from a long distance, as well as for the analysis of spatial distribution of particle size.

show abstract

Mie-Scattering Ellipsometry

Cited by 3 publications

References 32 publications

Integral Photography Technique for Three-Dimensional Imaging of Dusty Plasmas

Integral Photography Technique for Three-Dimensional Imaging of Dusty Plasmas

Observation and Analyses of Coulomb Crystals in Fine Particle Plasmas

Mie-Scattering Ellipsometry

Contact Info

Product

Resources

About