2010
DOI: 10.1109/tmtt.2010.2057172
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Microwave Power Limiting Devices Based on the Semiconductor–Metal Transition in Vanadium–Dioxide Thin Films

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Cited by 62 publications
(20 citation statements)
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“…The resistivity change is more than three orders of magnitude shown in the figure 4. This change in resistivity is comparable to devices prepared by others [5][6][7][8]. The sample exhibited a slight hysteresis when one compares the resistivity versus temperature curves for increasing and decreasing temperatures.…”
Section: Device Design and Fabricationsupporting
confidence: 84%
“…The resistivity change is more than three orders of magnitude shown in the figure 4. This change in resistivity is comparable to devices prepared by others [5][6][7][8]. The sample exhibited a slight hysteresis when one compares the resistivity versus temperature curves for increasing and decreasing temperatures.…”
Section: Device Design and Fabricationsupporting
confidence: 84%
“…We then calculate the threshold and conclusively demonstrate that the drop is caused by RF-triggering of the phase transition. Modulation of microwave transmission as a function of RF power in 2-port shunt devices has been studied [8], but here we explicitly demonstrate a complete phase transition with RF excitation in , and we examine power and switching characteristics therein.…”
Section: Introductionmentioning
confidence: 93%
“…The proposed research makes it possible for a novel tunable inductive structure with smaller size and straight forward manufacturing. The structure of the tunable inductor is a planar design with simple fabrication process, and the vanadium dioxide (VO 2 ) thin film stubs are used as switches instead of having any movable parts such as in a MEMS switch [7,8].…”
Section: Introductionmentioning
confidence: 99%