2010
DOI: 10.1016/j.nima.2009.10.096
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Microwave-induced chemical etching (MCE): A fast etching technique for the solid polymeric track detectors (SPTD)

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Cited by 29 publications
(8 citation statements)
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“…In this study, we have used a detector irradiated with particle to measure the VB [7]. Some initiatives have been undertaken in the last ten years to decrease etching time for speedier track development [9,10]. The objective of the research is to calculate registration characteristics such bulk etch rate VB, track etch rate VT, and etching ratio V. and etching characteristics such as the nuclear track detectors' diameter (d), number of tracks, and thickness of the removed layer (h), which are etched with a NaOH solution such as the nuclear track detectors' diameter (d), number of tracks, and thickness of the removed layer (h), which are etched with a NaOH solution…”
Section: Introductionmentioning
confidence: 99%
“…In this study, we have used a detector irradiated with particle to measure the VB [7]. Some initiatives have been undertaken in the last ten years to decrease etching time for speedier track development [9,10]. The objective of the research is to calculate registration characteristics such bulk etch rate VB, track etch rate VT, and etching ratio V. and etching characteristics such as the nuclear track detectors' diameter (d), number of tracks, and thickness of the removed layer (h), which are etched with a NaOH solution such as the nuclear track detectors' diameter (d), number of tracks, and thickness of the removed layer (h), which are etched with a NaOH solution…”
Section: Introductionmentioning
confidence: 99%
“…There are several devices used for etching SSNTDs: water bath, microwave and ultrasound, and all of them provide heat to the etchant solution in addition to specific waves in microwaves and ultrasound devices which is used to speed up the etching process. The etching time is reduced and the track edges are found to be smooth and well defined [2].…”
Section: Introductionmentioning
confidence: 99%
“…There are new approaches to deal with extremely dense overlapping tracks [29,30]. Recent developments of rapid etching techniques [31,32] can be adopted to reduce the etching time significantly. Effectiveness of these etching methods is discussed in section 8.…”
Section: Introductionmentioning
confidence: 99%