Microstructure of yttria stabilized zirconia deposited by plasma spraying

Jung, In‐Ha; Moon, Je Sun; Song, Kiwon; Yang, Mino

doi:10.1016/j.surfcoat.2003.10.129

Cited by 10 publications

(1 citation statement)

References 8 publications

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“…The improved conductivity can be attributed to the improved lamellar interface bonding at the high substrate temperature. Although from the previous investigations 18–23 it can be suggested that increasing the substrate temperature may improve the lamellar bonding, few attempts were made to investigate systematically the effect of the surface temperature of the deposit during deposition on the microstructure and electrical conductivity of plasma‐sprayed YSZ deposits.…”

Section: Introductionmentioning

confidence: 99%

Influence of Microstructure on the Ionic Conductivity of Plasma‐Sprayed Yttria‐Stabilized Zirconia Deposits

Xing

Zhang

2008

Journal of the American Ceramic Society

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Yttria-stabilized zirconia (YSZ) deposits were prepared by an atmospheric plasma spray (APS) on a stainless-steel substrate preheated to different temperatures from room temperature to 11001C. The microstructure of the deposits was characterized from polished and fractured cross sections by scanning electron microscopy (SEM). The ionic conductivity of the deposits was measured using both DC and AC methods, and the relationship between ionic conductivity and microstructure of deposits was examined. SEM observation revealed that the YSZ deposits exhibit different microstructures with different deposition temperatures. With the increase of the deposition temperature, the columnar grain growth across lamellar interfaces was enhanced and subsequently the intersplat bonding ratio in the deposit was improved. The ionic conductivity of YSZ deposits at the direction perpendicular to the deposit surface was significantly increased through the microstructure development on increasing the deposition temperature. However, it was found that the intergrain resistance changed little despite a remarkable change of the deposition temperature. A microstructure model is proposed to correlate the relative conductivity to the mean lamellar interface bonding ratio. The increase in ionic conductivity of the YSZ deposit with the deposition temperature can be attributed to the increase in the lamellar interface bonding ratio.

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Section: Introductionmentioning

confidence: 99%