2016
DOI: 10.1016/j.msea.2016.07.071
|View full text |Cite
|
Sign up to set email alerts
|

Microstructure evolution and shear fracture behavior of aged Sn3Ag0.5Cu/Cu solder joints

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
5

Citation Types

1
21
0

Year Published

2017
2017
2023
2023

Publication Types

Select...
7
1

Relationship

0
8

Authors

Journals

citations
Cited by 130 publications
(22 citation statements)
references
References 37 publications
1
21
0
Order By: Relevance
“…However, the thickness of Cu 6 Sn 5 and Cu 3 Sn IMCs formed at the interface of SAC solder and Cu substrate during manufacturing, repair and transportation decides the reliability of the solder joints [10]. With miniaturization, the reliability becomes the primary concern in fine pitch solder joints as the high current density and Joule heating drives the diffusion of Cu and Sn atoms along the interface [11].…”
Section: Introductionmentioning
confidence: 99%
“…However, the thickness of Cu 6 Sn 5 and Cu 3 Sn IMCs formed at the interface of SAC solder and Cu substrate during manufacturing, repair and transportation decides the reliability of the solder joints [10]. With miniaturization, the reliability becomes the primary concern in fine pitch solder joints as the high current density and Joule heating drives the diffusion of Cu and Sn atoms along the interface [11].…”
Section: Introductionmentioning
confidence: 99%
“…In the literature, investigating the reliability of isothermal aging of Sn-based lead-free solder joints has become an area of interest. Many scholars have studied the isothermal aging characteristics of SnAgCu/Cu [21][22][23][24][25], In-48Sn/Cu [26,27], and Sn-Bi/Cu [28,29] solder joints. They have focused on the growth kinetics of the interfacial IMC and the mechanical properties of solder joints during isothermal aging.…”
Section: Introductionmentioning
confidence: 99%
“…Besides, they obtained the activation energy of the interfacial IMC. Hu et al [23,24] further studied the relationships between the interfacial IMC and the fracture behavior of the Sn-3.0Ag-0.5Cu/Cu solder joints during isothermal aging. Nishikawa and Iwata [25] compared the reflow soldering and laser soldering and found that the growth of the interfacial IMC layer was slower by reflow soldering at the isothermal aging temperature 423 K. However, because of the slow reaction rate of the interfacial movement during isothermal aging, it is difficult to precisely measure the interfacial movement.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…As a result, the Sn-Ag-Cu (SAC) solder is developed as an alternative solder alloy. is solder alloy with different compositions has found wide acceptance in the industry owing to the amalgamation of good solder properties accompanied by reasonably decent mechanical properties [10][11][12].…”
Section: Introductionmentioning
confidence: 99%