Microstructure and properties of artificial grain boundaries in epitaxial YBA2Cu3O7−δ thin films grown on [001] tilt YZrO2 bicrystals

Alarco, José A.; Olsson, Eva; Ivanov, Z. G.; Winkler, Dag; Stepantsov, E. A.; Lebedev, O.I.; Vasiliev, Alexander; Tzalenchuk, Alexander; Киселев, Н.А.

doi:10.1016/0921-4534(95)00209-x

Cited by 27 publications

(6 citation statements)

References 24 publications

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“…The data do not, however, rule out a tunneling model because of the extremely inhomogeneous nature of grain boundaries in YBa 2 Cu 3 O 7−␦ . The microstructure of grain boundaries in thin film samples is typically very complex, 29,30 with structures that include nanoscale faceting 27,31 and microscale meandering 32 of the grain boundary. The capacitance per unit area of the grain boundary scales as the inverse of the boundary thickness ͑C / A = ͑ r 0 ͒ / t͒ whilst the resistance area product will probably scale approximately as R n A ϰ e −B͑t͒t , where B͑t͒ is a tunneling parameter.…”

Section: Discussionmentioning

confidence: 99%

Capacitance measurements on grain boundaries in Y1−xCaxBa2Cu3O7−δ

Ransley¹,

McBrien²,

Burnell³

et al. 2004

Phys. Rev. B

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The capacitance of 24°͓001͔ tilt calcium doped Y 1−x Ca x Ba 2 Cu 3 O 7−␦ grain boundaries has been measured for thin films with x in the range 0.0-0.3. The capacitance was determined from the hysteresis in the I-V characteristic. By measuring the capacitance as a function of the voltage across the junctions it was possible to observe the contribution of both parasitic substrate capacitance and heating to the hysteresis. These effects enable the determination of the intrinsic capacitance of the grain boundaries. The effect of thermal noise on the measurement is also assessed, and found to be much less than the observed changes in the capacitance. The capacitance is found to increase as the calcium doping increases: from 0.2 Fm −2 for x = 0.0 to a maximum of 1.2 Fm −2 for x = 0.3. The changes in the capacitance per unit area are observed to be inversely proportional to the corresponding changes in the resistance area product.

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Section: Discussionmentioning

confidence: 99%

Capacitance measurements on grain boundaries in Y1−xCaxBa2Cu3O7−δ

Ransley¹,

McBrien²,

Burnell³

et al. 2004

Phys. Rev. B

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“…While the first two factors are process-induced defects that can be rectified using careful process control, the third factor arises as a result of the misorientation across the grain boundary. The effect of grain boundary misorientation on transport properties has been studied by several researchers in recent years [1][2][3][4][5][6][7][8]. Dimos et al [1] reported that in thin films all boundaries with a misorientation angle greater than 10 • act as weak links and J c of these samples is significantly lower than that of their singlegrain counterparts.…”

Section: Introductionmentioning

confidence: 99%

Grain boundary studies in YBCO processed by the liquid phase removal method

Sathyamurthy¹,

Parikh²,

Saláma³

1997

Supercond. Sci. Technol.

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Results on grain boundary studies performed on high-current YBCO samples processed by melt texturing with the liquid phase removal method are reported. The misorientation of the a-b planes across each boundary (the kink angle) is measured in several samples. The results indicate that a predominantly large number of high-angle grain boundaries are present in these samples. The high current transport capacity of these bulk polycrystalline samples indicates that the liquid phase removal method is capable of producing good grain boundary links which allow high current to pass through. This lends promise to future applications of bulk YBCO polycrystalline materials

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“…TEM investigations of YBCO thin films grown on various STO bicrystals with misorientations of 24°, 36°, 53° and 67° were performed by various research teams. [78], [79], [80], [81], [82], [83] From these studies, it follows that the meandering behaviour observed does not depend on the misorientation of the bicrystal, but on the growth of the thin film. Even for small misorientations, thin film samples show GB meandering.…”

Section: Influence Of the Ybco Growth Process On Grain Boundary Strucmentioning

confidence: 81%

“…They also observed an increased facetting of the growth islands and consequently of the meandering. Alarco et al [81] [83] who also detected GB meandering.…”

Section: Influence Of the Ybco Growth Process On Grain Boundary Strucmentioning

confidence: 95%

Grain boundaries in high temperature superconducting ceramics

Ayache

2006

Philosophical Magazine

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International audienceThe aim of this paper is to review the different types of grain boundaries found in YBa₂Cu₃O_7-d superconducting ceramics which have been investigated over the past decade. A variety of samples covering a wide range of current density Jc values are examined including: classical bulk ceramics, melt-textured bulk ceramics, bulk and thin film bicrystals with specific orientations, thin films and single crystals. From electronic coupling, Jc is expected and found to decrease with increasing grain boundary (GB) misorientation. From the magnetic behaviour, the critical current density Jc(H) is expected to increase with the number of pinning centres. The properties of the various types of GB's are discussed. All the studies reviewed lead to the conclusion that grain boundaries in YBCO materials cannot be understood without specific information about their local composition, structure and electronic state. They confirm that research on bicrystals is crucial for high-temperature superconductor development

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Microstructure and properties of artificial grain boundaries in epitaxial YBA2Cu3O7−δ thin films grown on [001] tilt YZrO2 bicrystals

Cited by 27 publications

References 24 publications

Capacitance measurements on grain boundaries in Y1−xCaxBa2Cu3O7−δ

Capacitance measurements on grain boundaries in Y1−xCaxBa2Cu3O7−δ

Grain boundary studies in YBCO processed by the liquid phase removal method

Grain boundaries in high temperature superconducting ceramics

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