Microstructure and magnetic properties of Ti/CoCrPt/Ti pseudo-sandwich nanogranular films

Sun, Hui; Hu, Jin; Su, Zhibin; Xu, Jie; Feng, Shunzhen

doi:10.1109/tmag.2006.874095

Cited by 8 publications

(4 citation statements)

References 11 publications

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“…1) and x-ray diffractometry (XRD) indicate that the crystallographic c axis and the easy magnetization axis were oriented out of plane [39,46,47]. Along the out-of-plane direction, the magnetization did not change until the external magnetic field reached the switching or "depinning field" (H Dp ).…”

Section: Resultsmentioning

confidence: 99%

Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry study

et al. 2014

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Ferromagnetic domain patterns and three-dimensional domain-wall configurations in thin CoCrPt films with perpendicular magnetic anisotropy were studied in detail by combining magnetic force microscopy and polarized neutron reflectometry with micromagnetic simulations. With the first method, lateral dimension of domains with alternative magnetization directions normal to the surface and separated by domain walls in 20-nm-thick CoCrPt films were determined in good agreement with micromagnetic simulations. Quantitative analysis of data on reflectometry shows that domain walls consist of a Bloch wall in the center of the thin film, which is gradually transformed into a pair of Néel caps at the surfaces. The width and in-depth thickness of the Bloch wall element, transition region, and Néel caps are found consistent with micromagnetic calculations. A complex structure of domain walls serves to compromise a competition between exchange interactions, keeping spins parallel, magnetic anisotropy orienting magnetization normal to the surface, and demagnetizing fields, promoting in-plane magnetization. It is shown that the result of such competition strongly depends on the film thickness, and in the thinner CoCrPt film (10 nm thick), simple Bloch walls separate domains. Their lateral dimensions estimated from neutron scattering experiments agree with micromagnetic simulations.

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Section: Resultsmentioning

confidence: 99%

Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry study

et al. 2014

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“…Figure 1 shows out-of-plane hysteresis loops and in-plane virgin curves of 10-and 20-nm-thick CoCrPt films. Magnetic measurements and x-ray diffractometry of similar CoCrPt films [68][69][70] indicate that the crystallographic c axis and the easy magnetization axis are oriented out of plane. While the out-of-plane hysteresis loop is almost square for the 10-nmthick film, the 20-nm-thick film shows a slow approach to saturation which is attributed to the existence of small bubble domains that are magnetostatically stabilized by the surrounding regions.…”

Section: Experimental Methodsmentioning

confidence: 95%

Shape and strain-induced magnetization reorientation and magnetic anisotropy in thin film Ti/CoCrPt/Ti lines and rings

Navas

Nam²,

Velázquez³

et al. 2010

Phys. Rev. B

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The contributions to the magnetic anisotropy of thin-film rings and lines of width 50 nm and above made from Ti͑5 nm͒ / Co 0.66 Cr 0.22 Pt 0.12 ͑10 and 20 nm͒/Ti ͑3 nm͒ with a perpendicular magnetocrystalline anisotropy are investigated, using magnetic force microscopy to image the ac-demagnetized state. Four regimes of behavior were observed in both lines and rings. Samples with the largest widths ͑Ͼ500 nm͒ showed an out-ofplane maze domain structure typical of unpatterned films with domain widths of ϳ200 nm. As the linewidth decreased, a "bamboo" domain structure forms in which the domain walls lie approximately perpendicular to the linewidth. Further linewidth decreases result in a reorientation to a net in-plane anisotropy perpendicular to the linewidth, and for the narrowest lines, Ͻ200-nm wide, the anisotropy reorients in plane parallel to the line. The evolution of anisotropy is modeled in terms of contributions from magnetocrystalline, shape, and first-and second-order magnetoelastic terms, and good agreement with experiment is obtained, considering both bulk and surface anisotropy contributions.

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“…Single-layer CoCrPt films show out-of-plane easy magnetization direction because the anisotropy energy is primarily controlled by the magnetocrystalline anisotropy term (figure 1(a)). Magnetic measurements and x-ray diffractometry of similar CoCrPt films [36,52,55] indicate that the crystallographic c-axis and the easy magnetization axis are oriented out of plane. Along the out-of-plane direction, no magnetization reversal is observed until the external magnetic field reaches the 'depinning field' (H Dp ).…”

Section: Hysteresis Loops and Anisotropymentioning

confidence: 95%

Magnetization reversal and exchange bias effects in hard/soft ferromagnetic bilayers with orthogonal anisotropies

et al. 2012

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The magnetization reversal processes are discussed for exchangecoupled ferromagnetic hard/soft bilayers made from Co 0.66 Cr 0.22 Pt 0.12 (10 and 20 nm)/Ni (from 0 to 40 nm) films with out-of-plane and in-plane magnetic easy axes respectively, based on room temperature hysteresis loops and first-order reversal curve analysis. On increasing the Ni layer thicknesses, the easy axis of the bilayer reorients from out-of-plane to in-plane. An exchange bias effect, 2 consisting of a shift of the in-plane minor hysteresis loops along the field axis, was observed at room temperature after in-plane saturation. This effect was associated with specific ferromagnetic domain configurations experimentally determined by polarized neutron reflectivity. On the other hand, perpendicular exchange bias effect was revealed from the out-of-plane hysteresis loops and it was attributed to residual domains in the magnetically hard layer.

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Microstructure and magnetic properties of Ti/CoCrPt/Ti pseudo-sandwich nanogranular films

Cited by 8 publications

References 11 publications

Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry study

Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry study

Shape and strain-induced magnetization reorientation and magnetic anisotropy in thin film Ti/CoCrPt/Ti lines and rings

Magnetization reversal and exchange bias effects in hard/soft ferromagnetic bilayers with orthogonal anisotropies

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