2015
DOI: 10.1016/j.corsci.2014.11.004
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Microstructure and elemental composition of electrochemically formed dendrites on lead-free micro-alloyed low Ag solder alloys used in electronics

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Cited by 45 publications
(18 citation statements)
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References 35 publications
(36 reference statements)
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“…It was found that pure In and In-48Sn solder alloys were immune to ECM in pure water. Medgyes et al 55 used the transmission electron microscopy to detect the composition of dendrites which were formed during the ECM of Sn solder alloys with a low level of Ag. Sb was found in the dendrites, indicating that Sb also took part in the ECM of solder alloy process.…”
Section: Other Elementsmentioning
confidence: 99%
“…It was found that pure In and In-48Sn solder alloys were immune to ECM in pure water. Medgyes et al 55 used the transmission electron microscopy to detect the composition of dendrites which were formed during the ECM of Sn solder alloys with a low level of Ag. Sb was found in the dendrites, indicating that Sb also took part in the ECM of solder alloy process.…”
Section: Other Elementsmentioning
confidence: 99%
“…The time required to create dendritic bridges, which cause short circuits between two conductive paths, is determined by several factors including relative humidity, temperature, conductor material, conductor spacing, voltage difference, contamination amount, contamination type, etc. [17][18][19].…”
Section: Dendritesmentioning
confidence: 99%
“…According to the results, a micro-alloying element (antimony) has participated in the electrochemical processes. The presence of antimony is an unexpected result, since there are no reports about it in the ECM literature [25].…”
Section: Reliability and Quality Of Electronic Assembliesmentioning
confidence: 99%
“…Since the dendrite thickness was at ~100 nm scale, it was found that it could be directly analyzed by TEM without any post sample preparation procedure. The procedure of sample preparation contains four steps; (1) Removing the dendrite by using scotch-tape; (2) Positioning the dendrite onto the Mo micro-grid; (3) Immersing them into toluene for several hours; (4) Pick up the sample from toluene; then the sample is ready for TEM investigation [25]. In Fig.…”
Section: Reliability and Quality Of Electronic Assembliesmentioning
confidence: 99%