Materials Research Bulletin
 2015
DOI: 10.1016/j.materresbull.2015.01.006
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Microstructure and electrical properties of Na0.5Bi0.5(Ti0.98Zr0.02)O3 thin film deposited on indium tin oxide/glass substrate

Changhong Yang
1
,
Huiting Sui
2
,
Chao Feng
3
et al.
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Cited by 6 publications
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References 21 publications
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Orientation-dependent dielectric and ferroelectric properties of Pr3+-doped Na0.5Bi0.5TiO3 thin films

Huang
1
,
Ismail
2
,
Hao
3
et al. 2018
Appl. Phys. A
1
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Orientation-dependent dielectric and ferroelectric properties of Pr3+-doped Na0.5Bi0.5TiO3 thin films

Huang
1
,
Ismail
2
,
Hao
3
et al. 2018
Appl. Phys. A
1
0
0
0
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Thickness dependent growth and ferroelectric/dielectric properties of phase-pure 0.65Pb(Mg1/3Nb2/3)O3-0.35PbTiO3 thin film derived from a modified sol-gel process

Sui
1
,
Sun
2
,
Liu
3
et al. 2018
Ceramics International
3
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Ni doping to enhance ferroelectric, energy-storage and dielectric properties of lead-free NBT ceramic thin film with low leakage current

Yang
1
,
Qian
2
,
Han
3
et al. 2018
Ceramics International
32
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7
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