2001
DOI: 10.1116/1.1370178
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Microscopic field emission investigation of nanodiamond and AlN coated Si tips

Abstract: High current density field emission from arrays of carbon nanotubes and diamond-clad Si tips Demonstration of Li-based alloy coatings as low-voltage stable electron-emission surfaces for field-emission devices J. Appl. Phys. 85, 8405 (1999); 10.1063/1.370688 Model calculations of internal field emission and J-V characteristics of a composite n -Si and N-diamond cold cathode sourceWe have investigated the suitability of nanodiamond ͑ND͒ and AlN coated Si tip arrays for cold cathodes by means of a field emission… Show more

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Cited by 7 publications
(2 citation statements)
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“…Whilst the model of a gradual deterioration in the tip population is supported by slow changes in current and voltage measurements, there is little observational evidence of degraded tip populations. Photographs claiming to show partially eroded single tips are promising (Gunther et al 2001, Karain et al 1994, but not necessarily indicative of bulk array behaviour. There appears to be more evidence for the 'shallow ion implantation' mechanism proposed by Reuss and Chalamala (2003) which is supported by detailed studies at controlled pressures of large arrays, with >4 million molybdenum tips.…”
Section: Existing Experimental Evidence For the Suggested Failure Mec...mentioning
confidence: 99%
“…Whilst the model of a gradual deterioration in the tip population is supported by slow changes in current and voltage measurements, there is little observational evidence of degraded tip populations. Photographs claiming to show partially eroded single tips are promising (Gunther et al 2001, Karain et al 1994, but not necessarily indicative of bulk array behaviour. There appears to be more evidence for the 'shallow ion implantation' mechanism proposed by Reuss and Chalamala (2003) which is supported by detailed studies at controlled pressures of large arrays, with >4 million molybdenum tips.…”
Section: Existing Experimental Evidence For the Suggested Failure Mec...mentioning
confidence: 99%
“…6 In order to improve the FE performance of silicon emitters, the surface of silicon tips was functionalized by some carbon-based coatings such as diamondlike carbon and CN x thin films. [7][8][9][10] However, the intrinsic high compressive stress and low thermal stability restrict their practical applications. As an alternative candidate, the silicon tip arrays modified by ferroelectric thin films 11,12 were developed recently to enhance their FE behavior.…”
Section: Introductionmentioning
confidence: 99%