Microscale application of column theory for high resolution force and displacement sensing

Samuel, B. A.; Desai, Amit; Haque, M. Shamsul

doi:10.1063/1.1989440

Cited by 7 publications

(4 citation statements)

References 10 publications

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“…The list of possible applications includes sound attenuation (e.g., Yang, Dai, Chan, Ma, & Sheng, 2010) and vibration isolation (e.g., Park & Luu, 2007;Platus, 1999) and acoustic negative refraction (e.g., Fang et al, 2006). Applications are envisaged in high sensitivity sensors (through utilisation of postbuckling state of a beam (Samuel, Desai, & Haque, 2005) and actuators based on thermoelastic or piezoelectric coupling and in optimisation of existing technologies in which both stiffness and damping are important (Lakes & Drugan, 2002).…”

Section: Introductionmentioning

confidence: 99%

Elastic composite with negative stiffness inclusions in antiplane strain

Dyskin

Pasternak²

2012

International Journal of Engineering Science

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Section: Introductionmentioning

confidence: 99%

Elastic composite with negative stiffness inclusions in antiplane strain

Dyskin

Pasternak²

2012

International Journal of Engineering Science

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“…It can be seen that the graph is almost horizontal in the beginning and hence the spring constant of the column is small initially (0.77 mN/m). Previously, the authors have exploited stiffness attenuation and displacement amplification in the post-buckling deformation in a MEMS device [35]. The MEMS device is adequate for mechanical testing of softer specimens such as biological cells, where the forces on the specimen are at the very low end (nano to pico-Newtons).…”

Section: Device Designmentioning

confidence: 99%

Test Bed for Mechanical Characterization of Nanowires

Desai

Haque

2005

Proceedings of the Institution of Mechanical Engineers, Part N:

Self Cite

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Nanowires are one-dimensional solids that are deemed to be the building-block materials for next-generation sensors and actuators. Owing to their unique length scale, they exhibit superior mechanical properties and other length-scale-dependent phenomena. Most of these are challenging to explore, owing to the difficulties in specimen preparation, manipulation, and the requirement of high-resolution force and displacement sensing. To address these issues, a micromechanical device for uniaxial mechanical testing of single nanowires and nanotubes is used here. The device has 10 nN force and 1 nm displacement resolution and its small size (2 · 1 mm) allows for in situ experimentation inside analytical chambers, such as the electron microscopes. A microscale pick-and-place technique is presented as a generic specimen preparation and manipulation method for testing single nanowires. Preliminary results on zinc oxide nanowires show the Young's modulus and fracture strain to be about 76 GPa and 8 per cent respectively.

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“…Moreover, MEMS-based methods involve indirect measurements to infer nanomechanical quantities of interest and are generally limited to only small displacements/forces that do not reach the breaking point of the nanostructures under investigation. Efforts 39,42 are underway to alleviate some of these concerns.…”

Section: Introductionmentioning

confidence: 99%

A novel device for in-situ nanomechanics of 1-D nanostructures

Prakash

Kaul

Park

et al. 2011

JOM

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How would you… …describe the overall significance of this paper? The development of the in-situ test and characterization device enables the testing and characterization of mechanical properties of nanostructures, including biological materials, during high resolution nanoscale imaging. The availability of this versatile instrumentation will lead to the development of novel experiments at the nanoscale; results of these experiments will provide fundamental information about nanomechanics in nanostructured materials. …describe this work to a materials science and engineering professional with no experience in your technical specialty? The manuscript describes an insitu nanomechanical test and characterization device that takes advantage of the advanced visualization, nanomanipulation and nanopositioning capabilities of a finite element scanning electron microscope, and utilizes a highly sensitive three-plate capacitive transducer to make high-resolution displacement and force measurements in individual nanostructures. …describe this work to a layperson? Researchers all over the world are involved in investigating multi-scale mechanics of advanced nanoengineered materials and systems, including hybrid organic/inorganic structures, functional materials, high performance fibers, novel materials for energy, hard and soft tissues, to name a few. For these studies, insitu characterization of mechanical behavior at multiple length scales is essential, and the development of the nanoscale test and characterization device is expected to contribute greatly to the success and future growth of these technologies. This paper reports the development of an in-situ nanotensilometer that enables highly reliable mechanical tensile testing on individual micro-/nanoscale structures. The device features independent measurement of force and displacement histories in the specimen with nanoNewton force and sub-nanometer displacement resolutions, respectively. Moreover, the device is well suited for in-situ testing of free-standing micro/nanostructures within a high resolution scanning electron microscope, which permits continuous highresolution imaging of the specimen during straining. In order to conduct the nanomechanical tests the ends of the specimen are attached to the probe tips of the device using electron-beam induced deposition. The general capabilities and features of the nanotensilometer are illustrated by presenting results of nanomechanical tensile tests on electrospun polyaniline microfibers.

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Microscale application of column theory for high resolution force and displacement sensing

Cited by 7 publications

References 10 publications

Elastic composite with negative stiffness inclusions in antiplane strain

Elastic composite with negative stiffness inclusions in antiplane strain

Test Bed for Mechanical Characterization of Nanowires

A novel device for in-situ nanomechanics of 1-D nanostructures

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