Microcontroller susceptibility variations to EFT burst during accelerated aging

Wu, Jianfei; Li, C.; Li, B.; Wei-dong, Zhu; Wang, H.

doi:10.1016/j.microrel.2016.07.099

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Electromagnetic (Em) Characteristics1

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Cited by 8 publications

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“…ElectroMagnetic Robustness (EMR) studies the impact of circuit ageing on EMC [85]. Li, Wu et al [70], [86] studied the drift in the EM immunity of an MCU to Electrical Fast Transients (EFT) interference after accelerated ageing. They aged the device in incremental steps by applying high voltage (150% above nominal) and high temperature.…”

Section: Electromagnetic (Em) Characteristicsmentioning

confidence: 99%

A Review of Techniques for Ageing Detection and Monitoring on Embedded Systems

Leandro¹,

Martino²,

Fey³

et al. 2023

Preprint

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Embedded digital devices, such as Field-Programmable Gate Arrays (FPGAs) and Systems on Chip (SoCs), are increasingly used in dependable or safety-critical systems. These commodity devices are subject to notable hardware ageing, which makes failures likely when used for an extended time. It is of vital importance to understand ageing processes and to detect hardware degradations early. In this survey, we describe the fundamental ageing mechanisms and review the main techniques for detecting ageing in FPGAs, microcontrollers, SoCs, and power supplies. The main goal of this work is to facilitate future research efforts in this field by presenting all main approaches in an organized way.

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Section: Electromagnetic (Em) Characteristicsmentioning

confidence: 99%