Metrology in electricity and magnetism: EURAMET activities today and tomorrow

Piquemal, F.; Jeckelmann, B.; Callegaro, Luca; Hällström, Jari; Janssen, T.J.B.M.; Melcher, J.; Rietveld, G.; Siegner, U.; Wright, P.S.; Zeier, M.

doi:10.1088/1681-7575/aa7cae

Cited by 6 publications

(3 citation statements)

References 116 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…There are, however, still many challenges for electrical metrology ahead of us (see, e.g., ref. [] for an overview). Let us mention three of them:…”

Section: Future Prospects and Conclusionmentioning

confidence: 99%

The Elementary Charge for the Definition and Realization of the Ampere

Jeckelmann

Piquemal

2018

Annalen der Physik

View full text Add to dashboard Cite

The elementary charge e is one of the seven defining constants in the revised International System of Units (SI). Here, the determination of the elementary charge with the highest precision is discussed, including the results of the special CODATA adjustment leading to the fixed value of e. The various options to realize the ampere and the other electrical units in the revised SI, either through the counting of electrons by using single-electron tunneling devices or through the Josephson and quantum Hall effect, respectively, are further elucidated.

show abstract

“…There are, however, still many challenges for electrical metrology ahead of us (see, e.g., ref. [] for an overview). Let us mention three of them:…”

Section: Future Prospects and Conclusionmentioning

confidence: 99%

The Elementary Charge for the Definition and Realization of the Ampere

Jeckelmann

Piquemal

2018

Annalen der Physik

View full text Add to dashboard Cite

show abstract

“…However, the problems of its metrological support are not fully resolved. The attention of metrologists, in particular the European Association of National Metrology Institutes (EURAMET) is now focused on this issue [1]. The metrological importance of ADCs is the ability to ensure the required accuracy, unity and metrological reliability in such distributed systems.…”

Section: Introductionmentioning

confidence: 99%

Disassembly-free metrological control of analog-to-digital converter parameters

Bubela,

Kochan,

Więcław

et al. 2022

Metrology and Measurement Systems

View full text Add to dashboard Cite

The authors update the issue disassembly-free control and correction of all components of the error of measuring channels with multi-bit analog-to-digital converters (ADCs). The main disadvantages of existing methods for automatic control of the parameters of multi-bit ADCs, in particular their nonlinearity, are identified. Methods for minimizing instrumental errors and errors caused by limited internal resistances of closed switches, input and output resistances of active elements are investigated. The structures of devices for determining the multiplicative and nonlinear components of the error of multi-bit ADCs based on resistive dividers built on single-nominal resistors are proposed and analyzed. The authors propose a method for the correction of additive, multiplicative and nonlinear components of the error at each of the specified points of the conversion range during non-disassembly control of the ADC with both types of inputs. The possibility of non-disassembly control, as well as correction of multiplicative and nonlinear components of the error of multi-bit ADCs in the entire range of conversion during their on-site control is proven. ADC error correction procedures are proposed. These procedures are practically invariant to the non-informative parameters of active structures with resistive dividers composed of single-nominal resistors. In the article the prospects of practical implementation of the method of error correction during non-dismantling control of ADC parameters using the possibilities provided by modern microelectronic components are shown. The ways to minimize errors are proposed and the requirements to the choice of element parameters for the implementation of the proposed technical solutions are given. It is proved that the proposed structure can be used for non-disassembly control of multiplicative and nonlinear components of the error of precision instrumentation amplifiers.

show abstract

“…The practical realization of electrical units is conventionally achieved by means of devices exploiting quantum effects such as the quantum Hall effect, the Josephson effect and the single electron transistor effect. [3][4][5] However, these effects are observed in vacuum conditions at cryogenic temperatures and/or in presence of high magnetic fields usually obtainable only in a laboratory environment. All these requirements strictly hamper the scalability and on-chip integration of these metrological devices.…”

Section: Introductionmentioning

confidence: 99%

Memristive Devices for Quantum Metrology

et al. 2020

View full text Add to dashboard Cite

As a consequence of the redefinition of the International System of Units (SI) where units are defined in terms of fundamental physical constants, memristive devices represent a promising platform for quantum metrology. Coupling ionics with electronics, memristive devices can exhibit conductance levels quantized in multiples of the fundamental quantum of conductance G0=2e 2 /h. Since the fundamental quantum of conductance G0 is related only on physical constants that assume a fixed value in the revised SI, memristive devices can be exploited for the practical realization of a quantum-based resistance standard. Differently from quantum-Hall effect devices conventionally adopted for the realization of a resistance standard whose working principles requires cryogenic temperatures and/or high magnetic fields, memristive devices can operate in air at room temperature without the need of an applied magnetic field. In memristive devices, quantized conductance effects are related to ionic processes at the nanoscale that regulate the resistive switching mechanism underlaying memristive behaviour. Thanks to the high operational speed, high scalability down to the nanometer scale and CMOS compatibility, memristive devices allows on-chip implementation of a resistance standard required for the Received: ((will be filled in by the editorial staff))Revised: ((will be filled in by the editorial staff))

show abstract

Metrology in electricity and magnetism: EURAMET activities today and tomorrow

Cited by 6 publications

References 116 publications

The Elementary Charge for the Definition and Realization of the Ampere

The Elementary Charge for the Definition and Realization of the Ampere

Disassembly-free metrological control of analog-to-digital converter parameters

Memristive Devices for Quantum Metrology

Contact Info

Product

Resources

About