2020
DOI: 10.7498/aps.69.20200081
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Method of measuring absolute distance based on spectral interferometry using an electro-optic comb

Abstract: To explore a new generation of ranging method suitable for industrial applications, in this paper, a spectral interferometry ranging method based on electro-optic (EO) comb is proposed. The mathematical model of EO comb and the principle of spectral expansion are analyzed in detail. Besides, the factors affecting the non-ambiguous range and resolution of the spectral interferometry method are also discussed. According to the theoretical analysis, the resolution of spectral interference ranging is mainly affect… Show more

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Cited by 4 publications
(1 citation statement)
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“…The synthetic-wave absolute-distance interferometric measurement is a kind of high-accuracy no-guideway ranging technology based on the fraction-coincident method of the interference fringes, which provides an effective way to solve the technical problems of precision measurement and ultra-precision measurement of large-dimension workpieces. At present, the dual-frequency lasers [ 1 , 2 ] and optical-frequency combs [ 3 , 4 , 5 , 6 ] are normally used as the light sources for synthetic-wave absolute-distance interferometric systems, in which dual-frequency lasers have attracted great attention and strong research interests of scholars worldwide due to the advantages of simple structure and low cost. As the typical representatives of dual-frequency lasers, the Zeeman dual-frequency He-Ne laser at 632.8 nm [ 7 ], the two-longitudinal-mode He-Ne laser at 632.8 nm [ 8 ], and the birefringent dual-frequency He-Ne laser at 632.8 nm [ 9 ] have been successfully applied to the synthetic-wave absolute-distance interferometric system.…”
Section: Introductionmentioning
confidence: 99%
“…The synthetic-wave absolute-distance interferometric measurement is a kind of high-accuracy no-guideway ranging technology based on the fraction-coincident method of the interference fringes, which provides an effective way to solve the technical problems of precision measurement and ultra-precision measurement of large-dimension workpieces. At present, the dual-frequency lasers [ 1 , 2 ] and optical-frequency combs [ 3 , 4 , 5 , 6 ] are normally used as the light sources for synthetic-wave absolute-distance interferometric systems, in which dual-frequency lasers have attracted great attention and strong research interests of scholars worldwide due to the advantages of simple structure and low cost. As the typical representatives of dual-frequency lasers, the Zeeman dual-frequency He-Ne laser at 632.8 nm [ 7 ], the two-longitudinal-mode He-Ne laser at 632.8 nm [ 8 ], and the birefringent dual-frequency He-Ne laser at 632.8 nm [ 9 ] have been successfully applied to the synthetic-wave absolute-distance interferometric system.…”
Section: Introductionmentioning
confidence: 99%