2016
DOI: 10.1016/j.jcrysgro.2016.06.012
|View full text |Cite
|
Sign up to set email alerts
|

Metalorganic chemical vapor deposition of few-layer sp2 bonded boron nitride films

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

2
41
0

Year Published

2017
2017
2023
2023

Publication Types

Select...
6

Relationship

2
4

Authors

Journals

citations
Cited by 40 publications
(43 citation statements)
references
References 28 publications
2
41
0
Order By: Relevance
“…[28] Well ordered BN films are found to be the most ideal template for the combination of high-quality epitaxial growth, postgrowth device processing and mechanical lift-off. [28,32,33] High-resolution TEM images revealed the high-quality atomically abrupt interface between the GaN, AlN, and AlGaN layers. diameter) few-layer BN films with excellent thickness uniformity (<5%) and low roughness (<0.1 nm RMS) that are ideally suited to produce flexible AlGaN/GaN HEMTs.…”
Section: Flexible Gallium Nitridementioning
confidence: 99%
See 1 more Smart Citation
“…[28] Well ordered BN films are found to be the most ideal template for the combination of high-quality epitaxial growth, postgrowth device processing and mechanical lift-off. [28,32,33] High-resolution TEM images revealed the high-quality atomically abrupt interface between the GaN, AlN, and AlGaN layers. diameter) few-layer BN films with excellent thickness uniformity (<5%) and low roughness (<0.1 nm RMS) that are ideally suited to produce flexible AlGaN/GaN HEMTs.…”
Section: Flexible Gallium Nitridementioning
confidence: 99%
“…Further characterization of the BN film growth on sapphire necessary for the heterostructure growth is highlighted in previous works. [28,32,33] High-resolution TEM images revealed the high-quality atomically abrupt interface between the GaN, AlN, and AlGaN layers. This quality is further illustrated by low surface roughness (<0.3 nm RMS) revealed by atomic force microscopy (AFM) (Figure 2d).…”
Section: Flexible Gallium Nitridementioning
confidence: 99%
“…6(a) due to the self-terminating effect. 18,19 Despite similar thickness of the films, however, there is a significant change in optical absorption spectra, as shown in Fig. 6(b).…”
mentioning
confidence: 90%
“…[15][16][17] Recently, Q. S. Paduano et al, reported self-terminating effect in MOCVD growth of h-BN 18 and investigated effects of growth parameters including reactor pressure, and V/III ratio, defined as molar flow ratio between NH 3 and triethylborane (TEB) which are source of nitrogen and boron respectively, on thickness of MOCVD-grown h-BN. 19 X. Z.…”
mentioning
confidence: 99%
See 1 more Smart Citation