2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059)
DOI: 10.1109/relphy.2000.843903
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MEMS reliability in shock environments

Abstract: In order to determine the susceptibility of our MEMS (MicroElectroMechartical Systems) devices to shock, tests were performed using haversine shock pulses with widths of 1 to 0.2 ms in the range from 500g to 40,000g. We chose a surface-rnicromachined microengine because it has all the components needed for evaluation: springs that flex, gears that are anchored, arrd clamps and spring stops to maintain alignment. The microengines, which were unpowered for the tests, performed quite well at most shock levels wit… Show more

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Cited by 130 publications
(91 citation statements)
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“…Therefore, in the design of a MEMS device, both the electrostatic forces and the shock forces have to be taken into account, even if the microstructure undergoes small deflection and operates within a small range of the electrostatic force, to avoid this dynamic pull-in instability. This dynamic instability has been reported by Tanner et al [4] as a strange mode of failure, which is characterized by contacts and overlaps among the fingers and electrodes of the parallel-plate capacitors. Figure 5 illustrates the concept of this section.…”
Section: Single-degree-of-freedom Modelmentioning
confidence: 55%
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“…Therefore, in the design of a MEMS device, both the electrostatic forces and the shock forces have to be taken into account, even if the microstructure undergoes small deflection and operates within a small range of the electrostatic force, to avoid this dynamic pull-in instability. This dynamic instability has been reported by Tanner et al [4] as a strange mode of failure, which is characterized by contacts and overlaps among the fingers and electrodes of the parallel-plate capacitors. Figure 5 illustrates the concept of this section.…”
Section: Single-degree-of-freedom Modelmentioning
confidence: 55%
“…Such highly dynamic loads may lead to various damage mechanisms, such as forming of cracks and chipping of small fragments. In MEMS, shock loads can cause microstructures, such as suspended microbeams, to hit the stationary electrodes underneath them causing stiction [3] and short circuit problems [4], and hence failure in the device's function. Unlike failure in large devices, failure in MEMS does not have to mean fracture of structures due to high stresses; it can occur through stiction and electric short circuits due to contacts between movable and stationary electrodes.…”
Section: Introductionmentioning
confidence: 99%
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“…In [2][3], the MEMS material fatigue and aging under long-term cyclic loading has been discussed. In [4] [5], MEMS reliability under shock and vibration environments has been explored. In [6], efforts have been made to explore the physical mechanism of stiction in surface micromachining and its impact on MEMS reliability.…”
Section: Introductionmentioning
confidence: 99%