2020
DOI: 10.3390/nano10091677
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Memristive Devices from CuO Nanoparticles

Abstract: Memristive systems can provide a novel strategy to conquer the von Neumann bottleneck by evaluating information where data are located in situ. To meet the rising of artificial neural network (ANN) demand, the implementation of memristor arrays capable of performing matrix multiplication requires highly reproducible devices with low variability and high reliability. Hence, we present an Ag/CuO/SiO2/p-Si heterostructure device that exhibits both resistive switching (RS) and negative differential resistance (NDR… Show more

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Cited by 6 publications
(6 citation statements)
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References 29 publications
(35 reference statements)
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“…To explore the current transmission mechanism of the device, the I-V scan curve of the device was redrawn with double logarithmic coordinates under negative voltage, as shown in Figure 6 a–c. In a low resistance state (LRS), the slopes of the corresponding double logarithmic (I–V) curves of the device, Al/EA/ITO and Al/EA: (1.2 ωt%, 3 ωt%) MWCNTs/ITO, are 0.93, 0.99, and 0.99, respectively, which are all close to 1, and the conduction behaviour of carriers in this region obeys Ohm’s law [ 41 ]. In the low voltage range of the high resistance state (HRS), the corresponding slopes are 1.22, 1.17, and 1.04, and this region is represented as an ohmic conductive region.…”
Section: Resultsmentioning
confidence: 99%
“…To explore the current transmission mechanism of the device, the I-V scan curve of the device was redrawn with double logarithmic coordinates under negative voltage, as shown in Figure 6 a–c. In a low resistance state (LRS), the slopes of the corresponding double logarithmic (I–V) curves of the device, Al/EA/ITO and Al/EA: (1.2 ωt%, 3 ωt%) MWCNTs/ITO, are 0.93, 0.99, and 0.99, respectively, which are all close to 1, and the conduction behaviour of carriers in this region obeys Ohm’s law [ 41 ]. In the low voltage range of the high resistance state (HRS), the corresponding slopes are 1.22, 1.17, and 1.04, and this region is represented as an ohmic conductive region.…”
Section: Resultsmentioning
confidence: 99%
“…However, some devices switch oppositely due to their device structure, charge transport mechanism, and RS mechanism 20 . In the literature, the negative differential resistance (NDR) effect was also demonstrated for copper oxide-based RS devices 21 . Considering the technology demand, the research should be directed towards lowering the switching voltages.…”
Section: Resultsmentioning
confidence: 99%
“…The method employed to fabricate a device will affect its RS properties [ 100 , 101 , 102 ], with the same material potentially demonstrating different RS behavior when synthesized using different approaches [ 103 , 104 ]. Thus, various factors such as industrial practicality, cost-effectiveness, and RS performance need to be considered when fabricating an RS device.…”
Section: Fabrication Techniques For Resistive Switching Devicesmentioning
confidence: 99%
“…( c ) Steps involved in Ag/CuO/SiO 2 /p-Si memory device fabrication. Reprinted with permission from [ 101 ]. Copyright © 2023, MDPI.…”
Section: Figurementioning
confidence: 99%