Medium energy ion scattering of Gr on SiC(0001) and Si(100)

Abstract

Depth profiling of graphene with high-resolution ion beam analysis is a practical method for analysis of monolayer thicknesses of graphene. Not only is the energy resolution sufficient to resolve graphene from underlying SiC, but by use of isotope labeling it is possible to tag graphene generated from reacted ethylene. Furthermore, we are able to analyze graphene supported by oxidized Si(100) substrates, allowing the study of graphene films grown by chemical vapor deposition on metal and transferred to silicon. This introduces a powerful method to explore the fundamentals of graphene formation.

Highly Efficient Fluorescence Quenching with Graphene

“…The graphene layer was transferred to a Si substrate, and the MEIS measurements were performed using an HVEE system (100 KeV protons). Backscattered protons were analyzed with a toroidal electrostatic energy analyzer. , Surface plasmon resonance (SPR) and surface plasmon fluorescence spectroscopy (SPFS) measurements were done using a home-built SPR setup using a 633 HeNe laser. The sample was mounted on the SPR set up in a Kretschman configuration. − The biotin-based monolayer was assembled on the surface in situ using a 300 μL volume PDMS flow cell attached to the substrate.…”

“…Backscattered protons were analyzed with a toroidal electro-static energy analyzer. 27,28 Surface plasmon resonance (SPR) and surface plasmon fluorescence spectroscopy (SPFS) measurements were done using a home-built SPR setup using a 633 HeNe laser. The sample was mounted on the SPR set up in a Kretschman configuration.…”

Structural characterization of CdSe/ZnS quantum dots using medium energy ion scattering

“…2 but with a much higher energy resolution, capable to perform quantitative depth distribution with subnanometric resolution 3,4 even for light elements in graphene. 5 For that reason, MEIS has been recently used for nanostructures characterization, to determine size distribution of nanoparticles, geometric shapes, composition, stoichiometry and, its most promising application, elemental distribution inside the QDs, which is hardly achieved by any other analytical technique. [6][7][8] In this work, we studied sizes and elemental distribution of CdSe/ZnS core-shell quantum dots, 9 using MEIS in connection with other characterization techniques.…”

“…From the full 2D spectrum, we select a small angular region (of about 2. 5 ) where the scattering angles are summed to generate a 1D energy spectrum. We have taken two energy spectra centered at 120 and 128 of scattering angle.…”