Medição e correção de fase em reflexões acima do ângulo crítico

Abstract

In this work a correction to the phase shift observed in wavelets of reflections over the critical angle is evaluated. To measure the correct phase shift two different methods, rotation by maximization of the kurtosis and measurement of the instantaneous phase at the position of maximum value of the envelope, were tested. The objectives of this study was allow the usage of longer offset ranges, improving stacking, and also making possible to measure the phase correction that needs to be applied to each trace. The results of application of the two different methods were tested over synthetic and real data. In synthetic data it was possible to compare the phase that generated the data and improvements were observed in the stacking of the rotated data. And in real data an improvement of the interpretability of the section was observed.