1989
DOI: 10.1109/16.43771
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Mechanisms of current rectification in an STM tunnel junction and the measurement of an operational tunneling time

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Cited by 63 publications
(53 citation statements)
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“…6 Two years later, preliminary results were reported, and a tunneling time was derived. 7 In retrospect, the dc current induced by 1.06 m laser irradiation of a silicon sample was most likely due to the surface photovoltage effect. 8,9 In 1990, Kuk and co-workers observed small variations in laserinduced surface photovoltage on Si͑111͒ −7ϫ 7 with STM and tentatively attributed it to rectification.…”
mentioning
confidence: 99%
“…6 Two years later, preliminary results were reported, and a tunneling time was derived. 7 In retrospect, the dc current induced by 1.06 m laser irradiation of a silicon sample was most likely due to the surface photovoltage effect. 8,9 In 1990, Kuk and co-workers observed small variations in laserinduced surface photovoltage on Si͑111͒ −7ϫ 7 with STM and tentatively attributed it to rectification.…”
mentioning
confidence: 99%
“…For the tunneling junction without Ag nanoelectrode, the tunneling only occurs at the sharp protrusion of AFM tip (e.g., upmost atoms of the tip) in spite that the contact area can be much bigger. 16,26 The sharp protrusion generates much stronger electric field near the tip than that near the BTO/SRO interface, producing much different shapes between forward and reverse tunnel barriers, as schematically shown in Fig. 4(b).…”
mentioning
confidence: 99%
“…25 This is more or less analogous to a MOM point contact diode, in which electrons can tunnel easily from a sharp tip to a flat metal surface, while is much difficult to tunnel backward. 26,27 As a result, when replacing the sharp AFM tip with Ag electrodes, the point contact geometry becomes flat surface contact, hence greatly improves the symmetry of I-V curve.…”
mentioning
confidence: 99%
“…Thus, it appears that the accuracy of models of chemical reactivity would be increased by correcting for the duration of barrier penetration in addition to the well-known delays for passage over the barrier [SI. Preliminary experiments suggest that the interaction of tunneling particles with the timedependent potential in a laser-illuminated scanning tunneling microscope (STM) may be used as a clock to determine the tunneling time [6]. Adding a time-dependent potential to a static barrier, termed "barrier modulation" [ 71, changes the magnitude of the tunneling current.…”
Section: Introduction M Erostructures [L] and Josephson Junctionsmentioning
confidence: 99%