1997
DOI: 10.1016/s0921-4534(97)00112-3
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Mechanisms of cation defect formation in epitaxial YBa2Cu3O7−x films

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Cited by 6 publications
(6 citation statements)
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“…Raman spectra were excited by an Ar laser and measured by a spectrometer based on a double monochromator. To determine the composition of YBCO films, microanalysis of the lines Y L α , Ba L α , Cu K α , Cu L α and O K α was carried out using an x-ray 'Camebax' microanalyser [31]. The film morphology was studied with a CamScan Series 4-88 DV100 automated scanning electron microscope.…”
Section: Film Growth and Diagnostics Of Ybco Filmsmentioning
confidence: 99%
“…Raman spectra were excited by an Ar laser and measured by a spectrometer based on a double monochromator. To determine the composition of YBCO films, microanalysis of the lines Y L α , Ba L α , Cu K α , Cu L α and O K α was carried out using an x-ray 'Camebax' microanalyser [31]. The film morphology was studied with a CamScan Series 4-88 DV100 automated scanning electron microscope.…”
Section: Film Growth and Diagnostics Of Ybco Filmsmentioning
confidence: 99%
“…2 The electron energy in the exciting beam was 15 keV which allowed us to register simultaneously the spectral lines Y L␣, Ba L␣, Cu K␣, and O K␣ for all the elements, and determine the film thickness in the same experiment. The absolute accuracy of the chemical composition determination is 0.3%, 1.0%, 1.2%, and 2.0% for Y, Ba, Cu and O, respectively.…”
Section: B Quantitative Electron Probe Microanalysismentioning
confidence: 99%
“…A uniform oxygen distribution in YBa 2 Cu 3 O 7Ϫ␦ films has also been observed earlier. 1,2 It is probably a consequence of a high diffusion coefficient of oxygen in the YBa 2 Cu 3 O 7Ϫ␦ lattice. Thus, we can focus on variations in the cation composition only.…”
Section: A Chemical Composition Variationmentioning
confidence: 99%
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“…This origin can be dominant in thin YBCO films, as shown by simultaneous spatially resolved studies of cation composition and T c using electron probe microanalysis and low-temperature scanning electron microscopy (LTSEM), respectively. 4,5 Elastic stresses around structural defects can also lead to T cinhomogeneity due to a strong pressure dependence of T c in HTSC compounds. 6 T c increase due to edge dislocations and low-angle grain boundaries was calculated to be ∼ 1 K. 7 Spatial variations of the c-axis lattice parameter revealed by x-ray studies in YBCO films with almost uniform oxygen content also suggest stress-induced T cinhomogeneity.…”
Section: Introductionmentioning
confidence: 99%