Mechanisms for Energy Shifts of Atomic K X Rays

Hansen, P. G.; Jonson, B.; Borchert, G.; Schult, O.W.B.

doi:10.1007/978-1-4613-2417-1_6

Cited by 4 publications

(2 citation statements)

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“…For the RRS distribution the parameters C(E 0 ) and E b have to be fitted, whereas the energy response of the total scattered peak introduces the parameters a R and a C . Furthermore, the energy-channel and FWHM-energy relationships include the α, b, c 1 , c 2 parameters with central values and standard deviations given by equation (7).…”

Section: Fitting Of the Rrs Spectrummentioning

confidence: 99%

“…The chemical bonding of an element affects the emission of its characteristic x-rays in various ways. The formation of chemical bonding causes a migration of the valence electrons among participating atoms, thus reducing screening effects and increasing their inner shell binding energies [7]. This fact results in the chemical shifts of the energies of Kα, Kβ 1,3 and Kβ emission lines from compound targets of an element with respect to the metallic state.…”

Section: Introductionmentioning

confidence: 99%

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Chemical state speciation by resonant Raman scattering

Karydas

Galanopoulos

Zarkadas

et al. 2002

J. Phys.: Condens. Matter

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In the resonant Raman scattering (RRS) process the emitted photon exhibits a continuous energy distribution with a high energy cutoff limit. This cutoff energy depends on the chemical state of the element under examination. In the present work, the possibility of identifying the chemical state of V atoms by employing RRS spectroscopy with a semiconductor Si(Li) detector is investigated. A proton induced Cr Kα x-ray beam was used as the incident radiation, having a fixed energy lower than the V K-absorption edge. The net RRS distributions extracted from the energy dispersive spectra of metallic V and its compound targets were simulated by an appropriate theoretical model. The results showed the possibility of employing RRS spectroscopy with a semiconductor detector for chemical speciation studies.

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Section: Fitting Of the Rrs Spectrummentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%