“…Quantitative characterization of wrinkling process for film/substrate systems has motivated considerable research interests during past few years for understanding and predicting pattern formation both in nature ( Mahadevan and Rica, 2005;Efimenko et al, 2005;Yin et al, 2009;Wang and Zhao, 2015;Zhang et al, 2016;Sáez and Zöllner, 2017 ) and in modern industry ( Brau et al, 2011;Cai et al, 2011;Cao and Hutchinson, 2012;Sun et al, 2012;Zang et al, 2012;Xu et al, 2014;2015a;2015b;Fu and Cai, 2015;Xu and Potier-Ferry, 2016a;Huang et al, 2016 ). Broad applications range from micro/nano-fabrication of flexible electronic devices with functional surface patterning ( Bowden et al, 1998;Rogers et al, 2010;Li, 2016 ), microlens arrays production ( Chan and Crosby, 2006 ), adaptive aerodynamic drag control ( Terwagne et al, 2014 ), to the mechanical property measurement of material characteristics ( Howarter and Stafford, 2010 ).…”