2017
DOI: 10.1038/s41598-017-18267-0
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Quantitative predictions of diverse wrinkling patterns in film/substrate systems

Abstract: A basic characteristic of stiff film/soft substrate systems is their ability to experience large deformation under compressive stresses, which inevitably leads to formation of patterns on the surface. Such pattern formation is the result of loss of stability and symmetry breaking. Knowledge on how such instabilities arise and evolve is essential to describe, understand, predict, and ultimately to design complex functional materials and structures, for example the fabrication of stretchable electronic devices a… Show more

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Cited by 13 publications
(6 citation statements)
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“…Comparisons between planar and curved systems reveal that the surface curvature plays an important role in pattern formation and evolution. Most of these previous studies either focused on the various wrinkling modes on a curved surface [13,18,20], or emphasise the use of effective numerical methods for complex geometries [19,22].…”
Section: Introductionmentioning
confidence: 99%
“…Comparisons between planar and curved systems reveal that the surface curvature plays an important role in pattern formation and evolution. Most of these previous studies either focused on the various wrinkling modes on a curved surface [13,18,20], or emphasise the use of effective numerical methods for complex geometries [19,22].…”
Section: Introductionmentioning
confidence: 99%
“…The curved substrate could trigger more diverse wrinkling patterns than a planar substrate under simple a strain condition. [ 19–31 ] For example, Shao et al. successfully fabricated hierarchical wrinkled surfaces on plasma‐treated PDMS elastomers which initially have sinusoidal curvature on top.…”
Section: Introductionmentioning
confidence: 99%
“…We refer to Bowden et al [10,11], Li et al [12], the book by Goriely [13], and the more recent papers by Wang and Zhao [14] and Holland et al [15] for a comprehensive review of the literature and applications. As a prototypical structure, the buckling and post-buckling of a thin-film/substrate bilayer structure has probably received the most attention, partly because of the variety of behaviors that it exhibited and their obvious relevance to more complicated structures [16][17][18][19][20][21][22][23][24][25][26][27][28][29][30][31][32][33][34]. If both the layer and substrate are composed of neo-Hookean materials with shear moduli µ f and µ s , respectively, then there exists a critical moduli ratio which is approximately equal to 1.74 such that the initial wrinkling bifurcation is supercritical when µ f /µ s > 1.74 and subcritical otherwise [35,36].…”
Section: Introductionmentioning
confidence: 99%