2018
DOI: 10.1016/j.commatsci.2018.05.030
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Mechanical behavior of Cu-W interface systems upon tensile loading from molecular dynamics simulations

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Cited by 43 publications
(9 citation statements)
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“…During the past decades, the binary system of tungsten (W) and copper (Cu) has been attracted considerable research interests and has been commonly utilized as heat sinks in microelectronics, high voltage electrical contacts, nuclear fusion components, packing components, and welding elec trodes, etc [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16]. These possible applications are mainly attributed to the excellent combination of quite different prop erties of W and Cu, i.e.…”
Section: Introductionmentioning
confidence: 99%
“…During the past decades, the binary system of tungsten (W) and copper (Cu) has been attracted considerable research interests and has been commonly utilized as heat sinks in microelectronics, high voltage electrical contacts, nuclear fusion components, packing components, and welding elec trodes, etc [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16]. These possible applications are mainly attributed to the excellent combination of quite different prop erties of W and Cu, i.e.…”
Section: Introductionmentioning
confidence: 99%
“…Gong et al [4] investigated the relationship between the nature and structure of the interface under tensile loading by molecular dynamics calculations. Iwasaki [4] used molecular dynamics and investigated the adhesion strength of the Cu/W interface. All of the above interface studies are valuable, but there is still a need for further research and exploration.…”
Section: Introductionmentioning
confidence: 99%
“…Liang et al [14] obtained the interfacial energy and electronic structure of the tungsten-copper gradient interface by First principles calculations. Gong et al [4] investigated the relationship between the nature and structure of the interface under tensile loading by molecular dynamics calculations. Iwasaki [4] used molecular dynamics and investigated the adhesion strength of the Cu/W interface.…”
Section: Introductionmentioning
confidence: 99%
“…Copper-tungsten metal matrix composites (Cu-W MMCs) are the most widely used electrical contact materials in HVCBs. Cu-W MMCs consist of a W matrix with Cu being melted into the W skeleton, taking advantage of the excellent electrical and thermal conductivity properties of Cu, as well as the good mechanical properties and outstanding arc resistance performance of W [7][8][9][10][11][12][13][14]. With continuous switching cycles, Cu on the surface will be lost due to arc erosion, resulting in damages to the structure of the arcing contacts.…”
Section: Introductionmentioning
confidence: 99%