2010
DOI: 10.1007/978-3-642-15323-5_1
|View full text |Cite
|
Sign up to set email alerts
|

Measuring the Performance and Intrinsic Variability of Evolved Circuits

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2016
2016
2016
2016

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(1 citation statement)
references
References 11 publications
0
1
0
Order By: Relevance
“…It is not uncommon for modern integrated circuits to be comprised of more than one billion transistors (Walker et al, 2010). In most cases, these high transistor counts are the result of implementing multiple cores on a single chip (Krazit, 2011).…”
Section: Introductionmentioning
confidence: 99%
“…It is not uncommon for modern integrated circuits to be comprised of more than one billion transistors (Walker et al, 2010). In most cases, these high transistor counts are the result of implementing multiple cores on a single chip (Krazit, 2011).…”
Section: Introductionmentioning
confidence: 99%