1978
DOI: 10.7567/jjaps.17s2.326
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Measurements of X-Ray Anomalous Scattering Factors near the Cu K Absorption Edge by the Use of Synchrotron Radiation

Abstract: By the use of monochromatized X-rays from synchrotron radiation at Stanford Synchrotron Radiation Laboratory (SSRL), the reflectivity of Cu has been measured to determine the anomalous scattering factors f'(ω) and f''(ω) very near the K absorption edge. The results for f'(ω) and f''(ω) are compared with calculated values by the Hönl's theory, measured values of f''(ω) from the absorption coefficient µ(ω) and calculated values of f'(ω) from µ(ω) through the dispersion relation.

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Cited by 24 publications
(5 citation statements)
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“…There is a discrepancy due to a chemical shift by the oxidation state of the atom and the local chemical environment. Many attempts have been made near an absorption edge to measure anomalous scattering factors for relatively simple materials using various X-ray techniques, such as using an X-ray interferometer (Bonse & Materlik, 1976), the intensity ratio of Friedel-pair reflections (Fukamachi & Hosoya, 1975), total reflection measurement (Fukamachi et al, 1978), the index of refraction through a prism (Fontaine et al, 1985) and integrated intensity measurement (Templeton et al, 1980). A realistic determination of f 0 may be to use the dispersion relation of the Kramers-Kronig integral because of its easy access to the data.…”
Section: Introductionmentioning
confidence: 99%
“…There is a discrepancy due to a chemical shift by the oxidation state of the atom and the local chemical environment. Many attempts have been made near an absorption edge to measure anomalous scattering factors for relatively simple materials using various X-ray techniques, such as using an X-ray interferometer (Bonse & Materlik, 1976), the intensity ratio of Friedel-pair reflections (Fukamachi & Hosoya, 1975), total reflection measurement (Fukamachi et al, 1978), the index of refraction through a prism (Fontaine et al, 1985) and integrated intensity measurement (Templeton et al, 1980). A realistic determination of f 0 may be to use the dispersion relation of the Kramers-Kronig integral because of its easy access to the data.…”
Section: Introductionmentioning
confidence: 99%
“…Then, by the best use of an SSD (solid-state detector), it was shown that the determination of the anomalous-scattering factors as functions of energy and some applications of these factors such as polarity determination are feasible in a typical laboratory Hosoya, 1975;Fukamachi & Hosoya, 1975;Fukamachi, Hosoya & Okunuki, 1976a,b;Fukamachi, Hosoya, Kawamura & Okunuki, 1977. Concurrently, the advent of synchrotron radiation has opened great possibilities in this field (Bonse & Materlik, 1976;Phillips, Wlodawer, Yevitz & Hodgson, 1976;Phillips, Wlodawer, Goodfellow, Watenpaugh, Sieker, Jensen & Hodgson, 1977;Fukamachi, Hosoya, Kawamura & Hastings, 1977;Fukamachi, Hosoya, Kawamura, Hunter & Nakano, 1978).…”
Section: Introductionmentioning
confidence: 99%
“…These range from the EXAFS-type experiments of Dreier et al (1984) to X-ray interferometer beam contrast experiments made by Bonse and HartmannLotsch (1984). Measurements made by Fukamachi et al (1978) using the KramersKronig transform and the critical angle technique exhibit similar features. Within each experimental data set reproducibility and self-consistency are very good.…”
Section: (Aj Experiments Close To An Absorption Edge: Copper and Nickelmentioning
confidence: 48%