2006 European Microwave Conference 2006
DOI: 10.1109/eumc.2006.281071
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Measurements of thickness of metal films in sandwich structures by the microwave reflection spectrum

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Cited by 9 publications
(5 citation statements)
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“…To calculate the reflection S 11 and the transmission S 21 , coefficients of the electromagnetic wave at its normal incidence on an N layer structure, a matrix of wave transfer between regions with different values of wave propagation constants, can be used, similar to [15][16][17]:…”
Section: 1 Microwave Photonic Crystals: Structures With Forbidden Bmentioning
confidence: 99%
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“…To calculate the reflection S 11 and the transmission S 21 , coefficients of the electromagnetic wave at its normal incidence on an N layer structure, a matrix of wave transfer between regions with different values of wave propagation constants, can be used, similar to [15][16][17]:…”
Section: 1 Microwave Photonic Crystals: Structures With Forbidden Bmentioning
confidence: 99%
“…Computer simulations were carried to determine the possibility of using one-dimensional photonic crystals for creating matched loads. When calculating the reflection S 11 and the propagation S 21 coefficients of an electromagnetic wave, the matrix of wave transfer between regions with different values of the propagation constant of the electromagnetic wave was used, as was described in detail in [10,16,17]. During computer simulation in [2], the possibility of creating waveguide matched loads in an 8-and 3-cm wavelength bands was demonstrated.…”
Section: Application Of Microwave Photonic Crystalsmentioning
confidence: 99%
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“…In [8], [9] it was shown that placing the "quarter-wave" dielectric layer before a metal-semiconductor or metaldielectric structure while measuring the thickness of the metal layer from electromagnetic reflection spectra allows one to increase considerably the sensitivity of the method and to broaden out the range of measurable thicknesses.…”
Section: Introductionmentioning
confidence: 99%
“…Для расчета коэффициентов отражения и прохождения электромагнитной волны при ее падении на слоистую металлодиэлектрическую структуру, состоящую из N слоев, использовалась матрица передачи волны между областями с различными значениями постоянных распространения волны, подобно тому, как это было сделано в [14][15][16]:…”
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