2007 European Microwave Conference 2007
DOI: 10.1109/eumc.2007.4405160
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Measurement of the metal nanometer layer parameters on dielectric substrates using photonic crystals based on the waveguide structures with controlled irregularity in the microwave band

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Cited by 14 publications
(8 citation statements)
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“…The results of studies of frequency dependences of the reflection coefficients of electromagnetic radiation from one-dimensional photonic crystals containing, along with periodically changing dielectric filling, nanometer metal layers are presented in [9,10]. Computer simulations were carried to determine the possibility of using one-dimensional photonic crystals for creating matched loads.…”
Section: Application Of Microwave Photonic Crystalsmentioning
confidence: 99%
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“…The results of studies of frequency dependences of the reflection coefficients of electromagnetic radiation from one-dimensional photonic crystals containing, along with periodically changing dielectric filling, nanometer metal layers are presented in [9,10]. Computer simulations were carried to determine the possibility of using one-dimensional photonic crystals for creating matched loads.…”
Section: Application Of Microwave Photonic Crystalsmentioning
confidence: 99%
“…The specificity of the delay-line systems is the choice of their basic elements from metals and the need to take into account in the design the possibility of passing the electron beam interacting with the field. Examples of periodic structures used in delay-line systems are "meander," "counterpins," systems with alternating diaphragms, and so on.In the microwave range, the photonic crystal can be realized both on waveguides with dielectric filling [8,9] and on flat transmission lines with periodically changing stripe structure [10]. There are examples of the creation of photonic crystals in the optical, infrared, ultraviolet, microwave ranges.…”
mentioning
confidence: 99%
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“…С целью повышения чувствительности таких методов используются СВЧ-схемы, в которых частотная зависимость спектров отражения и прохождения для измеряемых слоистых структур резко изменяется при вариации параметров входящих в их состав слоев [6][7][8][9][10].…”
Section: Introductionunclassified
“…Одной из основных задач, решаемых при создании согласованных нагрузок, предназначенных для работы на малых и средних уровнях мощности СВЧ-излучения, является обеспечение согласования в максимально широком диапазоне частот при минимальных габаритах конструкции. В работах [3], [4] были исследованы частотные зависимости коэффициентов отражения электромагнитного излучения СВЧ-диапазона от фотонных кристаллов, содержащих нанометровые металлические слои. Показано, что коэффициент отражения в таких системах может изменяться в очень широких пределах при незначительных вариациях толщины металлической пленки, не превышающей нескольких десятков нанометров.…”
Section: Introductionunclassified