Measurements of the optical constants of scandium in the 50-1300eV range

Aquila, Andrew; Salmassi, Farhad; Gullikson, Eric M.; Eriksson, Fredrik; Birch, Jens

doi:10.1117/12.563615

Cited by 17 publications

(7 citation statements)

References 7 publications

(6 reference statements)

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“…Other than In, a source of low-absorption materials in the present range has been found among lanthanides, and many of them have been fully characterized recently (La [23], Tb [9], Gd [12], Nd [12], Yb [24,25], Ce [26], Pr [27], Eu [28], Tm [29], and Dy [30] [31][32][33][34]. This relatively low absorption makes them candidates for their use in novel multilayer coatings.…”

Section: Multilayer Designmentioning

confidence: 99%

Narrowband multilayer coatings for the extreme ultraviolet range of 50-92 nm

Vidal-Dasilva¹,

Fernández-Perea²,

Méndez³

et al. 2009

Opt. Express

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Abstract:A new type of multilayer coatings with narrowband reflection properties and peaked in the ~50-92 nm spectral range has been developed. Multilayers are based on Yb, Al, and SiO films and they have been prepared by thermal evaporation. Efficient multilayers based on Yb and Al, with an SiO protective layer were prepared, but they developed a dendrite structure, which was attributed to the reactivity between Al and Yb. Multilayers based on Yb and Al, with both SiO protective and barrier layers, resulted in efficient reflective filters, with no observable dendrite growth. The peak reflectance of aged multilayers was of the order of ~0.20, with bandwidths in the range of 12 to 22 nm FWHM. in the 2-830 eV spectral range using a transmittance method, and compilation of the revised optical constants of lanthanum, terbium, neodymium, and gadolinium," Appl. ©2009 Optical Society of America

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Section: Multilayer Designmentioning

confidence: 99%

Narrowband multilayer coatings for the extreme ultraviolet range of 50-92 nm

Vidal-Dasilva¹,

Fernández-Perea²,

Méndez³

et al. 2009

Opt. Express

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“…To obtain these measurements, thin transmission films of different thicknesses d is the calculated values [16] while the solid lines are the measured values [14]. This material is one of the materials used in tri-material multilayers described in section 1.2.3.…”

Section: Materials Selection and Measuring Atomic Scattering Factorsmentioning

confidence: 99%

Development of extreme ultraviolet and soft x-ray multilayer optics for scientific studies with femtosecond/attosecond sources

Aquila

2009

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The development of multilayer optics for extreme ultraviolet (EUV) radiation has led to advancements in many areas of science and technology, including materials studies, EUV lithography, water window microscopy, plasma imaging, and orbiting solar physics imaging. Recent developments in femtosecond and attosecond EUV pulse generation from sources such as high harmonic generation lasers, combined with the elemental and chemical specificity provided by EUV radiation, are opening new opportunities to study fundamental dynamic processes in materials. Critical to these efforts is the design and fabrication of multilayer optics to transport, focus, shape and image these ultra-fast pulses This thesis describes the design, fabrication, characterization, and application of v

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“…Until recently, these materials had not been fully characterized in the extreme ultraviolet (EUV)-soft x-rays. However, an increased interest in these materials has grown with the recent characterization of La 1 , Tb 1 , Gd 2 , Nd 2 , Yb 3 , Ce 4 , Pr 5 , Eu 6 and Tm 6 and of materials with close chemical properties such as Sc 7,8,9 and Y 10 .…”

Section: Introductionmentioning

confidence: 99%

Characterization of the optical constants of materials from the visible to the soft x-rays

Larruquert

Fernández-Perea

Vidal-Dasilva

et al. 2008

Advances in Optical Thin Films III

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A summary of the research performed on the optical characterization of Sc and of several lanthanides from the visible to the soft x-rays is presented. The low absorption of these materials mainly below the O 2,3 edge (L 2,3 edge for Sc) turns them promising materials for the realization of multilayer mirrors in a spectral range in which most materials in nature absorb strongly. Thin-film samples with several thicknesses of the target material were deposited by evaporation over thin-film substrates in UHV, and their transmittance was measured in situ. A wide spectral range of direct characterization, along with extrapolations to longer and shorter wavelengths either using literature data (when available) or model predictions, enabled the development of consistent optical constants over the whole spectrum. An assortment of consistency sum rules has been used, and it was found that each of them highlights a given spectral range, which may help evaluate the consistency of each part of the combined spectrum.

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Measurements of the optical constants of scandium in the 50-1300eV range

Cited by 17 publications

References 7 publications

Narrowband multilayer coatings for the extreme ultraviolet range of 50-92 nm

Narrowband multilayer coatings for the extreme ultraviolet range of 50-92 nm

Development of extreme ultraviolet and soft x-ray multilayer optics for scientific studies with femtosecond/attosecond sources

Characterization of the optical constants of materials from the visible to the soft x-rays

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