2015
DOI: 10.1016/j.ijheatmasstransfer.2015.07.064
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Measurements of the directional spectral emissivity based on a radiation heating source with alternating spectral distributions

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Cited by 34 publications
(12 citation statements)
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“…One of the available data source for POCO EDM-3 graphite reports the following equation between We have reported in Figure 5 the spectral emissivity values of porous graphites, with properties close to EDM-3, around 1 µm (laser used in our experiments) [18,[24][25][26], 1.5 µm (pyrometers used in our experiments) [18,26,27] and 0.65 µm [28,29] (different datasets available at this wavelength). It is difficult to identify clear trends in the temperature dependence except that the emissivity at 1-1.5 µm is higher than the total emissivity (in the range 0.85-0.95).…”
Section: B-optical Properties Of Edm-3mentioning
confidence: 90%
“…One of the available data source for POCO EDM-3 graphite reports the following equation between We have reported in Figure 5 the spectral emissivity values of porous graphites, with properties close to EDM-3, around 1 µm (laser used in our experiments) [18,[24][25][26], 1.5 µm (pyrometers used in our experiments) [18,26,27] and 0.65 µm [28,29] (different datasets available at this wavelength). It is difficult to identify clear trends in the temperature dependence except that the emissivity at 1-1.5 µm is higher than the total emissivity (in the range 0.85-0.95).…”
Section: B-optical Properties Of Edm-3mentioning
confidence: 90%
“…Zhang et al [29] developed a facility that uses a monochromator and an integrating sphere to measure the directional-hemispherical reflectance of samples heated by a cylindrical furnace up to 900 K. They measured the spectral emittance for 0.4 μm£l£10 μm of selective coatings for CSP application. Fu et al [73] constructed an indirect emittance measurement system using a hemispherical heating source and placed the sample at the center of the base of the hemisphere. The heating source is made of a quartz lamp array with reflecting walls to produce a nearly diffuse irradiation on the sample surface.…”
Section: Indirect Measurementsmentioning
confidence: 99%
“…This dynamic behavior of spectral emissivity poses a great challenge in the use of radiation thermometers. Multispectral radiation thermometry (MRT) can be used to address the above challenges and has widely been used in many applications [10][11][12][13][14][15][16][17][18][19][20][21][22][23][24][25] to measure temperature, mainly targeting metallic surfaces. Effectiveness of this technique is greatly dependent on emissivity model used.…”
Section: Introductionmentioning
confidence: 99%