2015 85th Microwave Measurement Conference (ARFTG) 2015
DOI: 10.1109/arftg.2015.7162919
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Measurement setup for X-Parameter characterization of bulk acoustic wave resonators

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Cited by 7 publications
(1 citation statement)
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“…In this technique, influence of spurious modes to nonlinear response can be easily considered since the spurious mode responses are represented by adding extra acoustic branches to the normal BVD model. Furthermore, a black box modeling technique (similar to S-Parameters for the linear regime) - the Polyharmonic Distortion Modeling has been used [72] with according measurement set up [73]. The advantage of the black box modeling approach is that no device physics knowledge is required and it can be easily exchanged between different suppliers without the concern about intellectual property.…”
Section: B Modeling Approach For Baw Devicesmentioning
confidence: 99%
“…In this technique, influence of spurious modes to nonlinear response can be easily considered since the spurious mode responses are represented by adding extra acoustic branches to the normal BVD model. Furthermore, a black box modeling technique (similar to S-Parameters for the linear regime) - the Polyharmonic Distortion Modeling has been used [72] with according measurement set up [73]. The advantage of the black box modeling approach is that no device physics knowledge is required and it can be easily exchanged between different suppliers without the concern about intellectual property.…”
Section: B Modeling Approach For Baw Devicesmentioning
confidence: 99%