Measurement of Young’s modulus and Poisson’s ratio for thin Au films using a visual image tracing system

Lee, S.J.; Han, Seungwoo; Hyun, Seungmin; Lee, H.J.; Kim, J.H.; Kim, Y.I.

doi:10.1016/j.cap.2008.08.048

Cited by 28 publications

(15 citation statements)

References 3 publications

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“…A variety of techniques have been employed to measure the elastic constants of thin films, for example, tensile test [7][8][9], substrate curvature technique [10][11][12][13], bulge test [14][15][16][17], microbeam bending or deflection technique [18,19], nanoindentation (NIP) [20][21][22][23][24][25][26][27], resonant ultrasound spectroscopy [28][29][30], surface guided wave technique [31][32][33], X-ray diffraction (XRD) technique [34,35], combination of 2 sin ψ X-ray diffraction and laser curvature methods [36,37], combination of acoustic microscopy and nanoindentation method [38,39]. Among the above-mentioned methods, it is available in a few cases that the methods are able to simultaneously determine the Poisson's ratio and Young's modulus of elasticity for functional thin films and thin film structures, but usually either Poisson's ratio or modulus of elasticity should be assumed a priori for determining the other one.…”

Section: Introductionmentioning

confidence: 99%

A practical method for simultaneous determination of Poisson’s ratio and Young’s modulus of elasticity of thin films

et al. 2011

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In this paper, based on the exact analytical solution of axisymmetric deformation of the circular membrane fixed at its edge under the action of uniformly-distributed loads, we propose a new method to be able to simultaneously determine Poisson's ratio and Young's modulus of elasticity for thin films. We also present a set of exact formulas used for simultaneously determining Poisson's ratio and Young's modulus of elasticity for free-standing thin films or coating thin films without residual stresses or pre-tension. This method has the advantages of simplicity and reliability, and it doesn't involve the substrate effect.

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Section: Introductionmentioning

confidence: 99%

A practical method for simultaneous determination of Poisson’s ratio and Young’s modulus of elasticity of thin films

et al. 2011

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“…Therefore the proposed method can be successfully applied for identification of material parameters of the accepted model. Lee et al (2009) discussed measurement of Young's modulus and Poisson's ratio for thin Au films using a visual image tracing system. This work proposes a visual image tracing (VIT) strain measurement system coupled with a micro-tensile testing unit, which consists of a piezoelectric actuator, a load cell, a microscope and two CCD cameras.…”

Section: Research On Mechanical Properties For Interface Structurementioning

confidence: 99%

“…Some literatures discussed the design and reliability of various interfaces with different methods (Yang, 2008;Evans et al, 1999;Ichimura and Ishii 2001;Heino, 2001;Fredriksson and Gudmundson, 2007;Du et al, 2007;Yang andLiao, 2008a, 2008b;Karkamkar et al, 2008;Iankov et al, 2008;Lee et al, 2009;Gou et al, 2015;Wu et al, 2011;Xu et al, 2011;Li et al, 2010;Sungtaek Ju, 2005;Shkarayev et al, 2001;Kay et al, 2006;Gu et al, 2001;Abramson et al, 2002;Stevens et al, 2007;Yang and Liao, 2007;Liao et al, 2009;Wang et al, 2014;Leuschner et al, 2015;Hölck et al, 2012). The design of the mechanical properties, thermal transfer properties and reliability is still the most important topic on the research for interface structure.…”

Section: Introductionmentioning

confidence: 99%

A review on design of interface structure in micro/nano manufacturing

Yang

Tang

Zhang

2016

IJMSI

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Abstract:Interface structure is a critical part of electronic components in computers, smart phones, automotive components and other electronic devices. Along with the development of technologies, the demand for electronic devices and their quality has increased rapidly in recent years. Thus, it is indispensable to research the design and reliability of interface structure. In this article, we give a review of recent investigations on the design and reliability of interface structure. Some academic developments on design and reliability of interface structure by considering thermal characteristics under different loading conditions are discussed.

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“…Some literatures discussed the various interfaces with different method [1][2][3][4][5][6][7][8][9][10][11][12][13][14]. More recently, many researchers focused their attentions on the interface adhesion, interfacial delamination, structure design and the film mechanical property.…”

Section: Introductionmentioning

confidence: 99%

Numerical and Test Evaluation on Adhesion Properties in Cr/Al Interface Film Structure

Yang¹,

Shang

2011

CNANO

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The aim of this article is to provide a systematic method to perform experimental test and theoretical evaluation on adhesion properties of the Cr/Al interface structure. A specified Cr/Al interface film assembly was deposited on the quartz glass by using RF magnetron sputtering. The elastic modulus and the hardness of the sample are tested by the nanoindentation tester. The test results show that the elastic modulus and the hardness of the sample have a nonlinear characteristic with different depth h of the interface structure. In the meantime, a finite element model is built to simulate the interface characteristics of the sample. The analysis shows that the stress mainly centralizes close to the top of the nanoindentation tester and the maximum stress occurs in the second layer Al film, not the first layer Cr film. The comparison between the test and the simulation shows the validity of the experimental test and the modeling method of each other. It builds a basis for future work such as fabrication of Cr/Al interface structure for micro/nano manufacturing.

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Measurement of Young’s modulus and Poisson’s ratio for thin Au films using a visual image tracing system

Cited by 28 publications

References 3 publications

A practical method for simultaneous determination of Poisson’s ratio and Young’s modulus of elasticity of thin films

A practical method for simultaneous determination of Poisson’s ratio and Young’s modulus of elasticity of thin films

A review on design of interface structure in micro/nano manufacturing

Numerical and Test Evaluation on Adhesion Properties in Cr/Al Interface Film Structure

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