1983
DOI: 10.1016/0030-4018(83)90368-1
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Measurement of thin film parameters using substrate excitation of leaky modes

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Cited by 8 publications
(2 citation statements)
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“…However, we have observed that leaky waveguide modes can be supported and measured if the poled glass layer is sufficiently thick and that these modes can be used to extract quantitative information about the poled glass layer. Here we use the term leaky modes to denote modes that propagate without total internal reflection at the interface between the poled glass and substrate [25][26][27]. Hence the optical field is continuously lost at each reflection at this interface since the modulus of the reflection coefficient is less than unity.…”
Section: B Prism Coupling Measurementsmentioning
confidence: 99%
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“…However, we have observed that leaky waveguide modes can be supported and measured if the poled glass layer is sufficiently thick and that these modes can be used to extract quantitative information about the poled glass layer. Here we use the term leaky modes to denote modes that propagate without total internal reflection at the interface between the poled glass and substrate [25][26][27]. Hence the optical field is continuously lost at each reflection at this interface since the modulus of the reflection coefficient is less than unity.…”
Section: B Prism Coupling Measurementsmentioning
confidence: 99%
“…where r=1 for TE propagation and r= npoled 2 for TM propagation [26,32]. It is common in the analysis of guided modes to approximate eqn.…”
Section: Simple Reflectivity Analysismentioning
confidence: 99%