Measurement of thermal distortion in high power laser glass elements using ptychography

Wang, H; Veetil, Suhas P.; Liu, C; Wang, J; Huang, Weijie; Zhang, Y; Pan, Xingchen; Zhu, Junxiang

doi:10.1088/1612-2011/12/2/025005

Cited by 7 publications

(3 citation statements)

References 17 publications

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“…The method of ptychography has already been used to measure the thermal distortion in high-power laser glass elements. 27 However, the data acquisition speed of conventional ptychography cannot meet the temporal precision requirements of the thermal recovery process. Thus, the proposed method with a much faster acquisition speed is definitely an advantage in such cases.…”

Section: Resultsmentioning

confidence: 99%

Ptychographic phase microscope based on high-speed modulation on the illumination beam

et al. 2017

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A type of ptychography-based phase microscope was developed by integrating a spatial light modulator (SLM) into a commercial wide-field light microscope. By displaying a moving pattern on the SLM to change the sample illumination and record the diffraction intensities formed, both the modulus and phase of the transmission function of the sample could be accurately reconstructed with formulas similar to those of common ptychography. Compared with other kinds of phase microscopes, the developed microscope has several advantages, including its simple structure, high immunity to coherent noise, and low requirement for quality optics. In addition, defects in the illumination beam are also removed from the reconstructed image. Further, this microscope’s fast data acquisition ability makes it highly suitable for many applications where highly accurate quantitative phase imaging is important, such as in living cells or other fragile biological samples that cannot sustain continuous imaging over a long period of time.

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Section: Resultsmentioning

confidence: 99%

Ptychographic phase microscope based on high-speed modulation on the illumination beam

et al. 2017

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“…Like conventional photoelastisity method, the fast axis of Q2 and the polarization axis of L2 is set at various angles γ and β to record the birefringent sample information under different states. In each state, the data collection process is similar to that in extended PIE (ePIE) [12,14], where an extra diffractive object is scanned relative to the probe, and a sequence of diffraction patterns is recorded in the far field by a CCD camera.…”

Section: Methodsmentioning

confidence: 99%

“…As an increasingly popular phase retrieval technique, ptychography can reconstruct the amplitudes and phases of diffractive object simultaneously, which provides a promising stress measurement method with simple structure, high immunity to noise and high spatial resolution [10][11][12][13][14][15]. Recently, some measurement methods based on ptychography for stress birefringence have been proposed [16][17][18][19][20].…”

Section: Introductionmentioning

confidence: 99%

Full-field stress measurement based on polarization ptychography

Cheng¹,

Zhang²,

Liu³

et al. 2019

J. Opt.

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In a high power laser system, the stress in large-aperture optical component could affect the system beam quality and safe operation. But studies on stress distribution and influence mainly focus on the finite element analysis. A new stress measurement method for large-aperture sample, which combines the ptychography with the polarization measurement technique, is presented. The birefringent sample is placed in the parallel probe-forming path. By the complex amplitude reconstructions of probes carrying stress information under different polarization states, the separation of two principal stress components is realized and quantitative full-field stress information is provided. The theoretical derivation and experimental implementation about how to extract strong stress information from phase are illustrated. The feasibility of this method is verified through a classic diametrically compressed disc, and the result for each stress component agrees well with the theoretical model. The proposed method avoids the scanning movement of sample and has a simple structure and strong anti-interference ability. It can be further combined with single-shot PIE techniques for rapid and online measurement, which provides a practical measurement means for the study of stress in large-aperture optics.

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On the stabilization of Ce, Tb, and Eu ions with different oxidation states in silica-based glasses

Tratsiak

Korzhik

Fedorov

et al. 2019

Journal of Alloys and Compounds

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Measurement of thermal distortion in high power laser glass elements using ptychography

Cited by 7 publications

References 17 publications

Ptychographic phase microscope based on high-speed modulation on the illumination beam

Ptychographic phase microscope based on high-speed modulation on the illumination beam

Full-field stress measurement based on polarization ptychography

On the stabilization of Ce, Tb, and Eu ions with different oxidation states in silica-based glasses

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