Measurement of the Integrated X-Ray Intensities of Ge and Si

Jennings, L. D.

doi:10.1063/1.1657351

Cited by 21 publications

(5 citation statements)

References 16 publications

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“…There exists a noticeable difference between the value of F = 1.64 (3) (Fehlmann & Fujimoto, 1975) and both our results and those of DeMarco & Weiss (1965b), Colella & Merlini (1966), Jennings (1969), Roberto & Batterman (1970) and Alkire, Yelon & Schneider (1982). In our opinion, it may be explained as follows.…”

Section: Discussion and Concluding Remarksmentioning

confidence: 59%

“…The existence of this reflection is mainly due to asymmetry in the bonding charge and, to a lesser degree, to anharmonic thermal vibrations. The data reported for the Si 222 reflection were obtained predominantly by measuring the integrated intensity of diffracted X-rays (G/Sttlicher & W61fel, 1959;Renninger, 1960;DeMarco & Weiss, 1965a;Colella & Merlini, 1966;Hewat, Prager, Stephenson & Wagenfeld, 1969;Jennings, 1969;Roberto & Batterman, 1970;Rozenberg & Kleschinski, 1976) and y-rays (Alkire, Yelon & Schneider, 1982). The Pendell6sung technique has also been used (Fujimoto, 1974;Fehlmann & Fujimoto, 1975).…”

Section: Introductionmentioning

confidence: 99%

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Double-crystal rocking curve of the forbidden Si 222 reflection

Éntin¹,

Смирнова²

1989

Acta Cryst Sect A

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The double-crystal rocking curve of the Si 222 reflection was obtained by a high-resolution technique. The angular half-width of the rocking curve was measured using Mo Ka radiation on a floating-zone-grown silicon single crystal and found equal to 0.07", this value being close to that calculated from the known structure factor of the Si 222 reflection. A refined value for the structure factor was 1.47 (2). For a Czochralski-grown Si single crystal with oxygen concentration ---.10 TM atoms cm -3, the angular half-width is higher by a factor of 2.5. The rocking-curve broadening is explained by the presence of oxygen in the silicon lattice.

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Section: Discussion and Concluding Remarksmentioning

confidence: 59%

Section: Introductionmentioning

confidence: 99%

Double-crystal rocking curve of the forbidden Si 222 reflection

Éntin¹,

Смирнова²

1989

Acta Cryst Sect A

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“…Our interpretation is complicated by uncertainty about the size of the anharmonic correction to the data of Aldred & Hart (1973a) Hewat et al (1969) 0.11 De Marco & Weiss (1965) 0.180 (10) Roberto & Batterman (1970) 0.182 (5) Jennings (1969) 0.185 (4) Fujimoto (I 974) 0.188 (2) Colella & Merlini (1966) 0.192 Renninger (1960) 0. 194 Fehlmann & Fujimoto (1975) 0.206 (4) Cramb (1970) 0-22 (2) G6ttlicher & W61fel (1959) 0.223 Mean 0.188 (31) Weighted mean* 0-1896 (35) Indirect measurements Aldred & Hart (1973b) 0.169 ( 10 -12 erg A -3 obtained by Roberto et al (1974) at room temperature, compared with the reasonably constant value of fl ~ 2.7 x 10 -12 erg A -3 at the higher temperatures, suggests that the effective one-particle potential approximation is not good, at least for anharmonic terms, at room temperature and below.…”

Section: Anomalous-dispersion Correctionsmentioning

confidence: 99%

Electron-density studies. III. A re-evaluation of the electron distribution in crystalline silicon

Price¹,

Maslen²,

Mair³

1978

Acta Cryst A

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Highly accurate absolute measurements of the X-ray structure factors of silicon [Aldred & Hart, Proc. R. Soc. London, Ser. A, (1973), 332, 223-238] have been used to analyse a number of models for the electron distribution. Initially, the valence-electron distribution (with the neon core assumed to be unmodified from that of the isolated silicon atoms) was built up with a radial basis of the form r ~ exp (-Q') and non-sphericity was allowed for by inclusion of octupole and hexadecapole terms. Improved representation was achieved with related models in which deformations from the total isolated-atom electron density were refined instead. The exact shape of the deformation electron density in the region of the bond was sensitively dependent on the monopole deformation term. The anomalous-dispersion contributions (Af') to the scattering factors were refined and found to be in agreement with recent interferometric measurements, but not with recent calculations. The octupole density term is slightly sharper at 293-2 than at 92.2 K, and the structure factor for the 222 reflection is predicted to be larger at the higher temperature. These effects may be due to a failure of the convolution approximation or to uncertainties in the anharmonic corrections to the structure-factor data.

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“…Therefore, although the integrated reflectivity of the analyzer is in principle a function of 2 0, in the present case this can be ignored since RY=2.4025 and cOS20AIRY=2"1084 do not differ too much. These values as well ~ts those of the other parameters were taken from the work by Jennings (1969). The resulting value of za@ at the Cu Ka wavelength is 9.013 × 10 -5.…”

Section: Ia= Clnl= 189 ×Losna(e/kev) -Amentioning

confidence: 99%

Powder diffraction with synchrotron radiation. I. Absolute measurements

Suortti¹,

Hastings²,

Cox³

1985

Acta Cryst Sect A

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G. CASCARANO AND C. GIACOVAZZO 413 (b) for cs reflexions the relation 0 += 0~-and 0 += -0~ are sufficiently accurate when Qi -1. Thus, information contained in cs phases proves to be not negligible compared with that provided by ncs phases. Concluding remarksThe two main obstacles to overcome when onewavelength methods are used exploiting the anomalous dispersion effect are: (a) finding the positions of the anomalous scatterers; (b) estimating phases of the complete crystal structure when the positions of the anomalous scatterers are known. In this paper a variety of new formulas has been derived, which may be used for both (a) and (b). The practical tests (on error-free diffraction data) show that the formulas are capable of making better estimates for certain magnitudes and phases, and also lead to the heavy-atom structure. APPENDIXIn accordance with Stephens (1963) and Giacovazzo (1979) the following approximation holds:where a is the solution of the equationand M is the Von Mises distribution.In accordance with (A.1) we can write (10) aswhere a is given by (13).Replacing (A.2) in (10) and in (9) gives ( AbstractAccurate measurements of the integrated intensities of several reflections from a standard powder sample of Ni have been made using monochromatic synchrotron X-ray radiation of wavelength 1.5413 A from a perfect double-crystal Si(lll) monochromator. A perfect Ge(lll) analyzer crystal was

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Measurement of the Integrated X-Ray Intensities of Ge and Si

Cited by 21 publications

References 16 publications

Double-crystal rocking curve of the forbidden Si 222 reflection

Double-crystal rocking curve of the forbidden Si 222 reflection

Electron-density studies. III. A re-evaluation of the electron distribution in crystalline silicon

Powder diffraction with synchrotron radiation. I. Absolute measurements

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