Double-crystal rocking curve of the forbidden Si 222 reflection

Éntin, I. R.; Смирнова, И. А.

doi:10.1107/s0108767389003879

Cited by 12 publications

(9 citation statements)

References 14 publications

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“…Roberto & Batterman, 1970). Accurate rocking-curve measurements in a double-crystal 222 nondispersive (+/À) setup were performed by Entin & Smirnova (1989). They reported a width of the double-crystal rocking curve measured with Mo K radiation of 0.339 mrad, which was consistent with the structure factor F 222 ¼ 1:47 reported by others.…”

Section: Discussionsupporting

confidence: 73%

High-resolution study of dynamical diffraction phenomena accompanying the Renninger (222/113) case of three-beam diffraction in silicon

Kazimirov¹,

Kohn²

2010

Acta Cryst Sect A

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X-ray optical schemes capable of producing a highly monochromatic beam with high angular collimation in both the vertical and horizontal planes have been evaluated and utilized to study high-resolution diffraction phenomena in the Renninger (222/113) case of three-beam diffraction in silicon. The effect of the total reflection of the incident beam into the nearly forbidden reflected beam was observed for the first time with the maximum 222 reflectivity at the 70% level. We have demonstrated that the width of the 222 reflection can be varied many times by tuning the azimuthal angle by only a few mrad in the vicinity of the three-beam diffraction region. This effect, predicted theoretically more than 20 years ago, is explained by the enhancement of the 222 scattering amplitude due to the virtual two-stage 000 ! 113 ! 222 process which depends on the azimuthal angle.

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Section: Discussionsupporting

confidence: 73%

High-resolution study of dynamical diffraction phenomena accompanying the Renninger (222/113) case of three-beam diffraction in silicon

Kazimirov¹,

Kohn²

2010

Acta Cryst Sect A

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“…The macrodeformation value ε was calculated in specimen 2 according to expression (2) by means of the v*s measuring. The magnitude of ε (3 x 10 -7 ) was found to be close to known literature data [3,10]. It should be noted that the alternative elastic macrodeformation of crystallographic planes {110) was measured in this case.…”

Section: Resultssupporting

confidence: 61%

“…Therefore, the static Debye-Waller factor can be correctly estimated for specimen 1 by means of fornula (3). It is important to underline that the obtained L440 value (Table) is four times higher than L220 (increased proportionally to H2 ) .…”

Section: Resultsmentioning

confidence: 99%

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Structure Perfection Study of Crystals Containing Micro- and Macrodistortions by X-Ray Acoustic Method

1994

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The X-ray acoustic method for determination the structure perfection integral claracteristics is suggested for sligltly imperfect dislocation-free crystals. The method is suitable for investigation of a crystal disturbed both by localized (microdefects) and by distributed (macrostrains) structure defects. It is based on ihe analysis of dependence of tle distance Δx between two minima, arising in the spatial intensity profile I(x) of the X-ray beam diffracted by acoustically excited crysial, upon ultrasound frequency νs . Using the daia Δx(νs) for two selected reflections, we calculated the values of the extinction lengths Λ whicl enabled us to ideniify the predominate type of structure disturbances as well as to estimate the static Debye-Waller factors e -L and tle period of the main macrodeformation λΜ fora sample containing simultaneously microdefects and periodic long range deformations. Such approach was used for studying the structure perfection of Czochralski-grown (Cz) and float-zone (FZ) sificon crysials.

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“…Thus, Fujimoto (1974) reported F Si = 1:51 AE 0:02 measured with Ag K and F Si = 1:48 AE 0:02 with Cu K based on accurate comparison of 222 and 333 integral intensities. Entin & Smirnova (1989) performed double-crystal 222 rocking-curve measurements in a non-dispersive setup, and from the fit of the rocking curve obtained F Si = 1.47. Earlier reported experimental results include F Si = 1:46 AE 0:04 (Roberto & Batterman, 1970), F Si = 1:44 AE 0:08 (DeMarco & Weiss, 1965) and F Si = 1:48 AE 0:03 (Jennings, 1969).…”

Section: Introductionmentioning

confidence: 99%

High-resolution study of (222, 113) three-beam diffraction in Ge

Kazimirov¹,

Kohn²

2011

Acta Cryst Sect A

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The results of high-resolution analysis of the (222, >113) three-beam diffraction in Ge are presented. For monochromatization and angular collimation of the incident synchrotron beam a multi-crystal arrangement in a dispersive setup in both vertical and horizontal planes was used in an attempt to experimentally approach plane-wave incident conditions. Using this setup, for various azimuthal angles the polar angular curves which are very close to theoretical computer simulations for the plane monochromatic wave were measured. The effect of the strong two-beam 222 diffraction was observed for the first time with the maximum reflectivity close to 60% even though the total reflection of the incident beam into a forbidden reflection was not achieved owing to absorption. The structure factor of the 222 reflection in Ge was experimentally determined.

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Double-crystal rocking curve of the forbidden Si 222 reflection

Cited by 12 publications

References 14 publications

High-resolution study of dynamical diffraction phenomena accompanying the Renninger (222/113) case of three-beam diffraction in silicon

High-resolution study of dynamical diffraction phenomena accompanying the Renninger (222/113) case of three-beam diffraction in silicon

Structure Perfection Study of Crystals Containing Micro- and Macrodistortions by X-Ray Acoustic Method

High-resolution study of (222, 113) three-beam diffraction in Ge

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