1990
DOI: 10.1111/j.1151-2916.1990.tb06435.x
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Measurement of Stresses Using Fluorescence in an Optical Microprobe: Stresses around Indentations in a Chromium‐Doped Sapphire

Abstract: A technique for measuring stress (positive and negative) with a lateral spatial extent of approximately 2 pm is introduced. The technique, implemented using a Raman microprobe, is demonstrated with measurements of. the frequency shift of the sharp, R-luminescence lines (2A and E to 4A2 radiative transitions) in, and around, a hardness indentation in a 0.06-wt%-chromium doped sapphire. From the observed frequency shifts the stresses in regions sampled in the hardness impression, in the complex stress field surr… Show more

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Cited by 81 publications
(54 citation statements)
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“…Hence, the linear variation of shift with applied stress (up to a few hundred megapascals; one unverified exception) and the numerical agreement with the non-polycrystal coefficient determinations surveyed above further support the observations. It is noted that the applied stress range of the polycrystal experiments was about an order of magnitude less than the single-crystal or fiber experiments (previous sections) and comparable to the intrinsic microstructural stresses expected and observed in bulk polycrystals [38][39][40][41][42][58][59][60][61][62][63][64][65][66][67]. Table 3 gives the first author, year published, citation, R-line coefficients (R1 or R2), and notes for original works that (experimentally) determined the temperature coefficients β (1) and β (2) ; see Eq.…”
Section: Bulk Polycrystal Testssupporting
confidence: 61%
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“…Hence, the linear variation of shift with applied stress (up to a few hundred megapascals; one unverified exception) and the numerical agreement with the non-polycrystal coefficient determinations surveyed above further support the observations. It is noted that the applied stress range of the polycrystal experiments was about an order of magnitude less than the single-crystal or fiber experiments (previous sections) and comparable to the intrinsic microstructural stresses expected and observed in bulk polycrystals [38][39][40][41][42][58][59][60][61][62][63][64][65][66][67]. Table 3 gives the first author, year published, citation, R-line coefficients (R1 or R2), and notes for original works that (experimentally) determined the temperature coefficients β (1) and β (2) ; see Eq.…”
Section: Bulk Polycrystal Testssupporting
confidence: 61%
“…Fiber measurements were compared with the predicted polycrystalline average values, e.g., Refs. [82,88], as were the uniaxial or bending polycrystal measurements [42,43,90]. These tests were good measures of the sum (which is well known; Table 1), but could not distinguish individual piezospectroscopic components.…”
Section: Discussionmentioning
confidence: 97%
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