The piezospectroscopic ͑PS͒ effect was studied in an intergrowth bismuth layer-structure ferroelectric ceramic Bi 5 TiNbWO 15 according to a micro-Raman spectroscopic evaluation. By using a ball-on-ring flexure configuration, a biaxial stress was generated in a Bi 5 TiNbWO 15 plate-like specimen and in situ collected Raman spectra were acquired and analyzed under several loading conditions. As the observed spectral line contained signals arising from the whole illuminated in-depth region, the laser probe information was deconvoluted ͑by means of an in-depth probe response function obtained according to the defocusing method͒ in order to deduce biaxial PS coefficients for the three Raman bands of Bi 5 TiNbWO 15 located at 763, 857, and 886 cm −1 , respectively. The biaxial PS coefficients of these bands were derived to be −1.74± 0.16, −2.51± 0.16, and-2.64± 0.31 cm −1 / GPa, respectively, and should be referred to the c axis of the Bi 5 TiNbWO 15 crystal.