2016
DOI: 10.1007/s11340-016-0206-6
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Measurement of Local Thermal Deformations in Heterogeneous Microstructures via SEM Imaging with Digital Image Correlation

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Cited by 19 publications
(8 citation statements)
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“…Therefore, for multimaterial samples, such as microelectronical components, it could potentially be more challenging to attain a highly homogeneous pattern, locally, over the different materials. Note that a continuous thin film of, for example, titanium could be added underneath the InSn pattern to alleviate this concern, although care should be taken that such a continuous film can sustain the deformation of the underlying specimen inside localisation or damage zones.…”
Section: Discussion: Applicability Of the Patterning Methodsmentioning
confidence: 99%
“…Therefore, for multimaterial samples, such as microelectronical components, it could potentially be more challenging to attain a highly homogeneous pattern, locally, over the different materials. Note that a continuous thin film of, for example, titanium could be added underneath the InSn pattern to alleviate this concern, although care should be taken that such a continuous film can sustain the deformation of the underlying specimen inside localisation or damage zones.…”
Section: Discussion: Applicability Of the Patterning Methodsmentioning
confidence: 99%
“…A body that does not absorb all incident radiation emits less total radiation than a black body and is characterized by an emissivity ε. Then its radiative flux can be expressed by (8) Practically, most of the engineering materials are considered as the gray body which is idealized to possess constant emissivity over all wavelengths and temperatures. Here, concerning the current issue of IR image correlation, the emissivity is assumed to be invariant during the material deformation for a given physical point.…”
Section: The Objective Of the Image Correlation Is To Determine A Tramentioning
confidence: 99%
“…They permit the experimental assessment of strain and temperature fields that, in a conventional sense, can only be numerically simulated using, for instance, finite element method (FEM). It should be emphasized that these optical methods do not have stringent requirements on the experimental conditions as the traditional interferometric approaches, and they can be applied to a broad range of spatial resolution from macroscale to microscale [8][9][10]. Thanks to these advantageous features, the DIC and IRT methods have been successfully used in the study of material deformation behaviors.…”
Section: Introductionmentioning
confidence: 99%
“…However, the immersion into the NP suspension (consisting of aggressive chemicals) can easily damage biological and other delicate specimens. Furthermore, the procedure needs significant modification based on the surface material properties [30,31], thereby impeding the possibility of a homogeneous pattern on heterogeneous (multiphase or multi-material) specimens.…”
Section: Introductionmentioning
confidence: 99%
“…Finally, other notable small-scale patterning techniques reported in the literature include Focused Ion Beam (FIB) or Focused Electron Beam (FEB) assisted Pt-dot deposition [32,33] and E-beam lithography [13,31,34]. These techniques result in very high quality patterns and the patterning reproducibility is specimen material independent.…”
Section: Introductionmentioning
confidence: 99%